2015
DOI: 10.1016/j.spmi.2015.03.028
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Effect of Er concentration on surface and optical properties of K doped ZnO sol–gel thin films

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Cited by 31 publications
(6 citation statements)
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“…where a is the absorption coefficient and l is the wavelength. The calculated values (k) are found in the range of 0.0003-0.0035, and the positive values indicate the strong absorbing (optical energy) nature of the deposited systems, 43 which can be attributed to the better smoothness of the surface and homogeneity of the compound. 44 Comparing the results, the CCTS-5 film shows a higher 'k' value than other films.…”
Section: Resultsmentioning
confidence: 95%
“…where a is the absorption coefficient and l is the wavelength. The calculated values (k) are found in the range of 0.0003-0.0035, and the positive values indicate the strong absorbing (optical energy) nature of the deposited systems, 43 which can be attributed to the better smoothness of the surface and homogeneity of the compound. 44 Comparing the results, the CCTS-5 film shows a higher 'k' value than other films.…”
Section: Resultsmentioning
confidence: 95%
“…The low surface‐roughness was further confirmed by ZYGO interferometry as shown in Figure ; the peak‐to‐valley (PV) and RMS values were tested to be 1.108λ and 0.188λ (λ = 632.8 nm), respectively. The surface‐roughness RMS value (1.74 nm) obtained from AFM of the silicone resin is even lower than that (6.91 nm) of the 1%‐K–2%‐Er codoped ZnO film, which has widely been applied to UV‐light emitters, transparent electronics, surface acoustic‐wave devices, etc . These results suggest that the internal stresses in the cured silicone resin, which were caused by nonuniform shrinkages and led to the variations in shape and size such as warpages, cracks, or corrugations, were nearly zero, upon the application of the stepwise heating method.…”
Section: Resultsmentioning
confidence: 99%
“…It is obviously visible that the extinction coefficient appears to become important only in the spectral absorption region for photon energy more than 1.5 eV [14]. The low value 'k' is conspicuously visible that indicates the homogeneous and smooth surface of the films as confirmed by AFM analysis [15]. The calculated 'k' value included the total optical losses caused by both absorption and scattering waves.…”
Section: Tablementioning
confidence: 98%