Effect of MgO spacer and annealing on interface and magnetic properties of ion beam sputtered NiFe/Mg/MgO/CoFe layer structures J. Appl. Phys. 112, 063906 (2012) Reactive sputter deposition of pyrite structure transition metal disulfide thin films: Microstructure, transport, and magnetism J. Appl. Phys. 112, 054328 (2012) Strong free-carrier electro-optic response of sputtered ZnO films J. Appl. Phys. 112, 053514 (2012) Influence of capping layers on CoFeB anisotropy and damping J. Appl. Phys. 112, 053909 (2012) Co-sputtering yttrium into hafnium oxide thin films to produce ferroelectric properties Al 0.278 In 0.722 N thin films have been grown on p-type Si(001) and c-plane sapphire substrates by employing radio-frequency magnetron-sputter deposition at elevated temperatures. High-resolution x-ray diffraction, as well as pole-figure measurements, reveals no phase separation of the thin films. The Al 0.278 In 0.722 N film grown on p-Si(001) substrate is a typical fiber-texture with AlInN(0001)// Si(001) while that on the c-sapphire exhibits the onset of epitaxy. Microscopic studies reveal that the growth is dominated by a columnar mechanism and the average columnar grain diameter is about 31.5 and 50.8 nm on p-Si(001) and c-sapphire substrates, respectively. Photoluminescence at room-temperature exhibits a strong emission peak at 1.875 eV, smaller than the optical absorption edge (2.102 eV) but larger than the theoretical bandgap energy (1.70 eV), which is attributable to the band-filling effect, as is supported by the high electron density of 4.5 Â 10 20 cm À3 . The n-Al 0.278 In 0.722 N/p-Si(001) heterostructure is tested for solar cells and the results are discussed based on the I-V characteristics and their fittings. V C 2012 American Institute of Physics.