2018
DOI: 10.1016/j.matlet.2018.03.095
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Effect of interface defect density on performance of perovskite solar cell: Correlation of simulation and experiment

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Cited by 103 publications
(52 citation statements)
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“…The trap‐state density ( n trap ) can be calculated according to Equation ntrap=2ϵϵ0VTFLeL2 where ϵ and ϵ 0 are the relative dielectric constant of perovskite (6.5) and vacuum, respectively. e is elementary charge, and L is the thickness of the film between two electrodes (≈500 nm).…”
Section: Resultsmentioning
confidence: 99%
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“…The trap‐state density ( n trap ) can be calculated according to Equation ntrap=2ϵϵ0VTFLeL2 where ϵ and ϵ 0 are the relative dielectric constant of perovskite (6.5) and vacuum, respectively. e is elementary charge, and L is the thickness of the film between two electrodes (≈500 nm).…”
Section: Resultsmentioning
confidence: 99%
“…To further validate the impact of UVO‐treated NiO x HTL on the performance of the PSCs with inverted p‐i‐n planar configuration, Lumerical's FDTD and DEVICE have been deployed to simulate optical‐field‐intensity distributions in the interfaces and detailed photovoltaic parameters ( V OC , J SC , FF, PCE), respectively. The values of work function and electrical conductivity of NiO x layer have been determined by our experimental results, while other parameters (such as energy bandgap, carrier mobility, refractive index and defect density of other used materials) have been extracted from published literatures . Figure a and b illustrate the optical field distributions with a wavelength of 650 nm in the structures of FTO/NiO x /MAPbI 3 and FTO/UVO‐NiO x /MAPbI 3 , respectively.…”
Section: Resultsmentioning
confidence: 99%
“…Also, Chouhan et al. [ 26 ] used the same software to analyse the effect of interface defect density on the PSC performance.…”
Section: Simulation Proceduresmentioning
confidence: 99%
“…37 Since mobile defects coexist with fixed impurities, application of pre-bias before capacitance measurement may alter the ionic distribution and the corresponding MS curve, as shown in Figure 1c. However, the effect does not persist and the solar cell relaxes to the initial situation in which the MS analysis is not Figure 1b as accurate values in PSCs, [38][39][40][41][42][43][44][45] what could be useful is to perform qualitative relative comparisons checking changes in the apparent bi V . 46 In this case it should be noticed that the exponential increase of capacitance at forward bias (see Figure 1a,b right axes) is related with the approaching and exceeding of the flat-band potential and the consequent going to the high injection current regime.…”
Section: T mentioning
confidence: 99%