2018
DOI: 10.1007/s00339-018-1659-5
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Effect of interfacial SiO2−y layer and defect in HfO2−x film on flat-band voltage of HfO2−x/SiO2−y stacks for backside-illuminated CMOS image sensors

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Cited by 7 publications
(1 citation statement)
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“…The lower binding energies of 18.1 eV and 18.7 eV, which are the weaker spin-orbit doublet peaks, may be due to the oxygen deficiency of Hf n+ –O (n < 4), which comes from HfSiOx. These binding energies are consistent with previously published data [ 61 ]. Figure 1 (d) shows the XPS Si2p core-level spectra.…”
Section: Resultssupporting
confidence: 93%
“…The lower binding energies of 18.1 eV and 18.7 eV, which are the weaker spin-orbit doublet peaks, may be due to the oxygen deficiency of Hf n+ –O (n < 4), which comes from HfSiOx. These binding energies are consistent with previously published data [ 61 ]. Figure 1 (d) shows the XPS Si2p core-level spectra.…”
Section: Resultssupporting
confidence: 93%