1980
DOI: 10.1016/0040-6090(80)90287-4
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Effect of internal stress on the fundamental reflectivity spectra of ZnTe thin films

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Cited by 3 publications
(2 citation statements)
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“…2 there are identified distinct maxima signed E 1 , E 1 + ∆ 1 and E 2 and, additionally, a small maximum E 0 at the wavelength 822 nm (1.51 eV), corresponding to the exciton transition at the Γ point of the Brillouin zone (forbidden energy gap). The change in the slope of reflectivity spectra and intensity ratios of maxima indicates occurrence of fairly small internal strains and deformation effects reported in [10,11]. In Fig.…”
Section: Methodsmentioning
confidence: 89%
“…2 there are identified distinct maxima signed E 1 , E 1 + ∆ 1 and E 2 and, additionally, a small maximum E 0 at the wavelength 822 nm (1.51 eV), corresponding to the exciton transition at the Γ point of the Brillouin zone (forbidden energy gap). The change in the slope of reflectivity spectra and intensity ratios of maxima indicates occurrence of fairly small internal strains and deformation effects reported in [10,11]. In Fig.…”
Section: Methodsmentioning
confidence: 89%
“…This implies a severe local distortion of the crystal lattice, which could be associated with a strong local stress. The E 2 -maximum derives from transitions occurring at a large number of low-symmetry critical points in the volume of the BZ, which are well known to be affected by stress [41] and topological disorder, which can cause the decrease of the symmetry of the crystal and therefore have a substantial influence on the optical transitions, mainly at low-symmetry critical points in the BZ.…”
Section: Zn 1−x Mn X Sementioning
confidence: 99%