Bibliography Nyquist scattering time τq quantum lifetime τtr transport time θ contact angle U voltage UG gate voltage UOCV open circuit voltage Uxx, Uxy longitudinal and transverse voltage drop v, vD drift velocity vF Fermi velocity W width ξ valley index vi * Although higher values of |∆n| have successfully been achieved by this method, dielectric breakdown remains a fundamental limit to eld eect gating, making it dicult to reach values beyond |∆n| = 10 13 cm −2 .