2021
DOI: 10.1038/s41598-021-84976-2
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Effect of load sequence interaction on bond-wire lifetime due to power cycling

Abstract: Experimental investigations on the effects of load sequence on degradations of bond-wire contacts of Insulated Gate Bipolar Transistors power modules are reported in this paper. Both the junction temperature swing ($$\Delta T_{j}$$ Δ T j ) and the heating duration ($$t_{ON}$$ t … Show more

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Cited by 4 publications
(2 citation statements)
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“…In [25] under the assumption of a single degradation mechanism, combined power cycling stresses verified the applicability of LDA rule. In [26], combined experimental tests at different ΔTj values did not verify the linearity of the Miner's rule, particularly in the case of a combined stress with significantly different ΔTj values (varying between 110°C and 70°C). In [27], [28], the impact of combined vibrating and thermal cycling stresses was analyzed.…”
Section: Introductionmentioning
confidence: 84%
“…In [25] under the assumption of a single degradation mechanism, combined power cycling stresses verified the applicability of LDA rule. In [26], combined experimental tests at different ΔTj values did not verify the linearity of the Miner's rule, particularly in the case of a combined stress with significantly different ΔTj values (varying between 110°C and 70°C). In [27], [28], the impact of combined vibrating and thermal cycling stresses was analyzed.…”
Section: Introductionmentioning
confidence: 84%
“…In practical applications, power devices are often subjected to a wide temperature range, 4 such as the high-temperature weather of up to 45℃ on the ground in summer. The power device's ambient temperature can even exceed 100℃ when coupled with limited space inside the converter.…”
mentioning
confidence: 99%