“…The peaks at 15.02°, 28.19°, 32.12°, 41.88°, 49.96°, and 52.45°, could be ascribed to the (001), (100), (101), (102), (110) and (111) planes of SnS 2 , respectively . The characteristic peaks at 28.44°, 47.30°, 56.12°, 69.13°, and 76.37° were assigned to the (111), (220), (311), (400), and (331) planes of Si, respectively . No additional diffraction peaks were observed, indicating that no other crystalline impurities were formed.…”