2011
DOI: 10.1016/j.msea.2010.10.028
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Effect of processing parameters on the evolution of dislocation density and sub-grain size of a 12%Cr heat resistant steel during creep at 650°C

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Cited by 52 publications
(20 citation statements)
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“…At this time, the deformation can increase the nucleation rate of cementite by strain- induced precipitation and the holding process will provide adequate time for cementite to precipitate. [23][24][25] This result was also confirmed by thermomechanical processing of experiment of steel sheets such that a large number of nanoscale cementites precipitated in lath bainite after plastic deformation and holding process.…”
supporting
confidence: 60%
“…At this time, the deformation can increase the nucleation rate of cementite by strain- induced precipitation and the holding process will provide adequate time for cementite to precipitate. [23][24][25] This result was also confirmed by thermomechanical processing of experiment of steel sheets such that a large number of nanoscale cementites precipitated in lath bainite after plastic deformation and holding process.…”
supporting
confidence: 60%
“…Traditionally there are some methods such as Xray diffraction (XRD) [38][39][40][41], transmission electron microscopy (TEM) [42,43], electron backscatter diffraction (EBSD) [44,45], electron channeling contrast imaging [46], and hydrogen diffusivities [47]. Recently, the dislocation density has been estimated from hardness measurement [48,49].…”
Section: Resultsmentioning
confidence: 99%
“…As such, an interest in the application of STEM using BF, annular bright field (ABF), or annular dark field (ADF) to image dislocation networks in unirradiated materials has grown. [81][82][83][84][85][86][87][88][89] The reason for such interest is that STEM significantly reduces the elastic contrast in the background by smearing out thickness-dependent contrast, it can be performed on thicker samples, and the traditional gÁb invisibility criterion can remain applicable. As discussed in previous sections, the imaging in STEM and CTEM is equivalent due to reciprocity when imaging conditions in both modes are carefully selected.…”
Section: Dislocation Loop Imagingmentioning
confidence: 99%