“…The reason of the oscillations of G(V ) is a dependence of the phase shift between two waves on the electron energy, which depends on the bias eV . This effect has been observed experimentally [1,2,3,4] and investigated theoretically [5,6,7,8,9]. In an earlier paper [5] we demonstrated that this G(V ) dependence can actually be used to determine the exact location of a defect underneath a metal surface by means of scanning tunnelling microscopy (STM).…”