“…Interconnection dimensions are important because too long a route would cause timing problems and stray effects, such as unwanted inductance, whereas too short of an interconnection height can result in greatly reduced reliability lifetime. [4]- [6] Mirrored structures, where similar components are located on opposite sides of a PCB, have been studied for chip scale package (CSP)/BGA modules, and some finite element modeling (FEM) data along with test results can be found in the literature [7]- [12]. Mirroring causes challenges in the areas of design and material, such as Increased stiffness due to restricted warpage of the PCB [7], [8], which can be considered the single major issue affecting the lifetime of interconnections in mirrored module configurations Microstructural effects due to a second reflow process, i.e., extended growth of rigid and brittle intermetallic phases Differing interconnection heights of mirrored components, depending on the number of reflows they have been through (top/bottom side) [9] Irregular solder joint shape, voids, partial separation between the solder and the intermetallic layer [10] Some proposed solutions to mitigate the increased stress levels have been considered, those being Offsetting the mirrored components [7], [8] Using a thinner PCB [11] Using more compliant materials and smaller components [8] Redesigning the solder pad [12] BGA Interconnection Reliability in Mirrored Module Configurations Juha Hagberg, Jussi Putaala*, Juha Raumanni, Olli Salmela, Timo Galkin T This article presents the results of thermal cycling tests (TCT) and simulations of plastic BGA (PBGA) components mounted on one side (single side configuration) and different mirrored configurations on a PCB.…”