“…Res. Ltd., Oxfordshire, UK) on standard c-Al 2 O 3 substrates using migrationenhanced epitaxy for the 65-nm-thick nucleation layer and multi-stage metal-modulated epitaxy (MME) for the rest buffer layer at a substrate temperature varied between 780-850 • C [34][35][36]. These templates have an RMS roughness of about 0.6 nm and threading dislocation densities of ~5 × 10 9 cm −2 .…”