Nanoindentation in Materials Science 2012
DOI: 10.5772/48106
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Effect of the Spherical Indenter Tip Assumption on the Initial Plastic Yield Stress

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Cited by 9 publications
(7 citation statements)
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“…This is as expected since ion-implantation-induced changes in elastic modulus are small [14,20]. At ~25 nm depth the unimplanted sample shows a large pop-in, indicative of dislocation nucleation in the initially relatively defect free material at the onset of plastic deformation [21]. In the implanted sample, there are no obvious pop-ins.…”
Section: Main Textsupporting
confidence: 78%
“…This is as expected since ion-implantation-induced changes in elastic modulus are small [14,20]. At ~25 nm depth the unimplanted sample shows a large pop-in, indicative of dislocation nucleation in the initially relatively defect free material at the onset of plastic deformation [21]. In the implanted sample, there are no obvious pop-ins.…”
Section: Main Textsupporting
confidence: 78%
“…This was done to avoid a full meshing and to allow increased simulation size. The material properties of the diamond indenter tip (with modulus of =1143 GPa) used in the experiment, was accounted for in the simulation by scaling the results with an effective modulus Eeff (322.58 GPa), where, 1 = 1− 2 + 1− 2 [45].…”
Section: Scaling With Effective Modulusmentioning
confidence: 99%
“…Instrumented nanoindentation is widely used to probe micrometer-scale mechanical properties such as hardness and elastic modulus over a wide range of materials and applications. Using nanoindentation to quantitatively probe mechanical properties at submicrometer length-scales faces extreme challenges including sensitivity to the shapes of the probe and sample surface at the nanometer scale, the lack of traceability to the Système International (SI) for nN-level forces and potential problems with the use of the Hertz approximation for extracting stresses from measured load–displacement curves. Many of these issues can be effectively investigated using SI-traceable measurements to validate high-resolution finite element analysis (FEA) models of the tip–sample interaction. , These validated FEA models can, in turn, be used to provide boundary conditions for atomistic simulations using classical potentials. , However, exploring the tip–sample interactions at the atomic length scale is not amenable to this approach since the chemical interactions are difficult to model using classical potentials. Some steps in this direction have been made using ReaxFF potentials that, in principle, allow for a more accurate simulation of bond formation and breaking processes than traditional force fields .…”
Section: Introductionmentioning
confidence: 99%