2022
DOI: 10.1103/physrevmaterials.6.054409
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Effect of thickness and frequency of applied field on the switching dynamics of multiferroic bismuth ferrite thin films

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Cited by 7 publications
(3 citation statements)
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“…The films were deposited on (001)-oriented single-crystal SrTiO 3 (STO) substrates (purchased from CrysTec GmbH) and SrRuO 3 (SRO)-buffered SrTiO 3 . The 50 nm SrRuO 3 conducting layer was separately grown using pulsed laser deposition (PLD) with a 248 nm KrF excimer laser to serve as a bottom electrode for the electrical measurements; the deposition process is described elsewhere …”
Section: Methodsmentioning
confidence: 99%
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“…The films were deposited on (001)-oriented single-crystal SrTiO 3 (STO) substrates (purchased from CrysTec GmbH) and SrRuO 3 (SRO)-buffered SrTiO 3 . The 50 nm SrRuO 3 conducting layer was separately grown using pulsed laser deposition (PLD) with a 248 nm KrF excimer laser to serve as a bottom electrode for the electrical measurements; the deposition process is described elsewhere …”
Section: Methodsmentioning
confidence: 99%
“…The 50 nm SrRuO 3 conducting layer was separately grown using pulsed laser deposition (PLD) with a 248 nm KrF excimer laser to serve as a bottom electrode for the electrical measurements; the deposition process is described elsewhere. 60 Crystal structure analysis of the films was carried out using a Philips X'pert Pro X-ray diffraction (XRD) system. The XRD system used a Cu Kα source (λ = 1.5418 Å) equipped with a Ni Kβ filter.…”
Section: ■ Experimental Sectionmentioning
confidence: 99%
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