2009
DOI: 10.1016/j.cap.2009.01.032
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Effect of tin concentrations on properties of indium tin oxide films deposited on PET substrate under various conditions

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Cited by 5 publications
(4 citation statements)
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“…More fine characterization tools should be employed in the future to unveil this interesting phenomenon. Different from Bae et al [10] and Dekkers et al [21], these results were basically consistent with Kang et al's report [14]. It seemed that the Sn dopant was not entirely detrimental to the electron conducting when ITO films were amorphous.…”
Section: Effect Of Thicknesssupporting
confidence: 81%
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“…More fine characterization tools should be employed in the future to unveil this interesting phenomenon. Different from Bae et al [10] and Dekkers et al [21], these results were basically consistent with Kang et al's report [14]. It seemed that the Sn dopant was not entirely detrimental to the electron conducting when ITO films were amorphous.…”
Section: Effect Of Thicknesssupporting
confidence: 81%
“…% doping ratio were less than the value listed in Table 2. The main difference in this paper is that deliberately substrate heating or low-temperature annealing (<100 • C) was carried out or extra gas species were fed in the sputtering chamber compared with other researchers [14,15].…”
Section: Effect Of Thicknessmentioning
confidence: 99%
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