2017
DOI: 10.1007/s10854-017-7751-3
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Effect of variation of thickness of TiO2 on the photovoltaic performance of n-TiO2/p-Si heterostructure

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Cited by 17 publications
(5 citation statements)
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“…On the other hand, electrons face hardly any barrier to surmount; hence, they drift easily from the TiO 2 side to the Si side, giving rise to photocurrent. Such heterojunctions with valence band offset values as large as 2.8 eV, facilitating electron-selective transport, can be used as highly efficient photodetectors …”
Section: Resultsmentioning
confidence: 99%
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“…On the other hand, electrons face hardly any barrier to surmount; hence, they drift easily from the TiO 2 side to the Si side, giving rise to photocurrent. Such heterojunctions with valence band offset values as large as 2.8 eV, facilitating electron-selective transport, can be used as highly efficient photodetectors …”
Section: Resultsmentioning
confidence: 99%
“…Such heterojunctions with valence band offset values as large as 2.8 eV, facilitating electron-selective transport, can be used as highly efficient photodetectors. 32 In light of the energy band diagram, we discuss the role of PMMA in improving photodetector performance. In our measurement, ΔE v does not show any significant change for STOPM compared to that of STO.…”
Section: Acs Appliedmentioning
confidence: 99%
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“…The electrical parameters of the diode and the conduction mechanism are determined by analysing the I-V curves of the p-NiO/n-Si junction. According to the modified Shockley equation, the current characteristic of the p-n junction can be written as [45]:…”
Section: Resultsmentioning
confidence: 99%
“…TiO 2 is a material possessing a wide variety of qualities, including excellent chemical inertness, superior photocatalytic activity, good optical transmittance with a high refractive index in the visible range, and strong mechanical hardness. It is widely used in photoconversion-related issues, e.g., photodetectors, photocatalysis, and resistive switching devices, as a passivation layer in solar cell devices, high-K gate dielectric for the transistors, etc. …”
Section: Introductionmentioning
confidence: 99%