2011
DOI: 10.1016/j.jcrysgro.2010.11.040
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Effects of argon flow on heat transfer in a directional solidification process for silicon solar cells

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Cited by 47 publications
(21 citation statements)
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“…During the process, the argon flow is in the range of 10-40 l/min and the pressure inside the furnace chamber is in the range of 500-800 mbar. The argon inlet contributes to the melt mixing quite significantly (Li et al, 2011(Li et al, , 2012b. The argon generates a cold spot in the center of the melt surface and triggers a strong surface tension-driven flow (Marangoni flow), which improves melt mixing substantially.…”
Section: The Hardwarementioning
confidence: 99%
“…During the process, the argon flow is in the range of 10-40 l/min and the pressure inside the furnace chamber is in the range of 500-800 mbar. The argon inlet contributes to the melt mixing quite significantly (Li et al, 2011(Li et al, , 2012b. The argon generates a cold spot in the center of the melt surface and triggers a strong surface tension-driven flow (Marangoni flow), which improves melt mixing substantially.…”
Section: The Hardwarementioning
confidence: 99%
“…The algorithms for the global modeling of heat transfer in a DS furnace have been published in our previous papers [8,13]. The Boussinesq assumption and the low Mach approximation were applied to the melt and argon gas flows, respectively.…”
Section: Model Descriptionmentioning
confidence: 99%
“…The temperature and velocity boundary conditions between the argon and the melt domains should be fully coupled to investigate the argon flow effect on the melt convection and the m-c interface shape. As the radial temperature distribution is not uniform at the melt surface due to gas cooling [8], the surface tension is considered. The coupled thermal and velocity boundary conditions at the m-g interface are:…”
Section: Model Descriptionmentioning
confidence: 99%
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“…It has been considered in all investigations to date. The effect of gas shear stress on melt convection of the DS process has been studied by Li et al [7,10]. It was also widely investigated by many researchers for the Czochralski (CZ) silicon growth [11,12].…”
Section: Introductionmentioning
confidence: 99%