2017
DOI: 10.1016/j.vacuum.2016.09.018
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Effects of bottom electrode on resistive switching of silver programmable metallization cells with Gd x O y /Al x O y solid electrolytes

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Cited by 11 publications
(8 citation statements)
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“…E form values found for LiCdF 3 and LiCdCl 3 are −20.61 and − 13.96 eV/atom, respectively. The cubic structure with a negative E form value indicates that the material is stable [25–27]. The concern E form of materials shows a negative value which proves that materials are stable.…”
Section: Resultsmentioning
confidence: 99%
“…E form values found for LiCdF 3 and LiCdCl 3 are −20.61 and − 13.96 eV/atom, respectively. The cubic structure with a negative E form value indicates that the material is stable [25–27]. The concern E form of materials shows a negative value which proves that materials are stable.…”
Section: Resultsmentioning
confidence: 99%
“…The thermal coefficient of resistance at LRS was extracted and is found to be approximately −1.05 × 10 −2 K −1 , indicating the conductive filament of oxygen vacancies as proposed in our previous work. [ 62 ] Figure 4e shows the retention properties of the Gd x O y memristors with H 2 plasma surface modified CSA graphene BEs at room temperature. The resistance at LRS and HRS was measured at a 0.1 V reading voltage.…”
Section: Resultsmentioning
confidence: 99%
“…It can be observed that the operation power of the TLG/Ni sample at a set process is 7.72 nW, which is much lower than that of the r-TLG/Ir and B-TLG/Ir samples. The memory devices without TLG sheets were also investigated and have been proposed in our previous work . The memory with Ir-BE, labeled as Ir, showed a Schottky-emission-dominated RS at the interface between the Ir-BE and the RS layer, whereas the sample with Ni-BE, labeled as Ni, demonstrated a cation-dominated RS behavior within the Gd x O y /Al x O y layer.…”
Section: Resultsmentioning
confidence: 99%
“…The memory devices without TLG sheets were also investigated and have been proposed in our previous work. 43 The memory with Ir-BE, labeled as Ir, showed a Schottky-emission-dominated RS at the interface between the Ir-BE and the RS layer, whereas the sample with Ni-BE, labeled as Ni, demonstrated a cation-dominated RS behavior within the Gd x O y /Al x O y layer. The typical I−V characteristics and the statistical distributions of the operating voltages, resistances at the HRS and LRS, and the resistance ratio of the samples with Ir-and Ni-BEs are shown in Figure S7 of the Supporting Information.…”
Section: ■ Results and Discussionmentioning
confidence: 99%