1971
DOI: 10.1063/1.1660594
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Effects of Contact Placement and Sample Shape in the Measurement of Electrical Resistivity

Abstract: The resistivity of a sample is given by ρ=VI−12πsF, where V is the voltage, I is the current, s is the voltage contact separation, and F is a correction factor appropriate to the sample geometry. Correction factors are found for the cases of parallelepiped samples with (1) nonequidistant point contacts symmetrically located on the top face, and (2) point voltage contacts symmetrically located on the top face and point current contacts centered on the end faces. In studies of these cases, curves are given for d… Show more

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Cited by 29 publications
(9 citation statements)
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“…The placement of contact points followed the directions given in the literature: [17] points for the application of current were placed at a distance from the extremity equal to 1/10 of the sample's length (150 mm), while those for reading the potential drop were separated by a distance equal to 2/3 of the distance between the points of application of current. The standard resistance consisted of a sample identical to the test sam-ples, but aged in a condition of saturation of the aging effects (200 ЊC/21,600 seconds).…”
Section: Electrical Resistivity Measurementsmentioning
confidence: 99%
“…The placement of contact points followed the directions given in the literature: [17] points for the application of current were placed at a distance from the extremity equal to 1/10 of the sample's length (150 mm), while those for reading the potential drop were separated by a distance equal to 2/3 of the distance between the points of application of current. The standard resistance consisted of a sample identical to the test sam-ples, but aged in a condition of saturation of the aging effects (200 ЊC/21,600 seconds).…”
Section: Electrical Resistivity Measurementsmentioning
confidence: 99%
“…Thus in electrochemical cells conducting both ions and electrons (MIECs), Eq. (7) and the rest of the discussion must in general be modified. 11 This is discussed below.…”
Section: I-v Relation For a Uniform Conductormentioning
confidence: 99%
“…1 The common four-point electrode arrangements are as follows: (1) linear, with planar current carrying electrodes; (2) electrodes placed on the periphery of a circular sample (as with the van der Pauw method); 2 and (3) four-point contacts in a row upon a large flat sample. [3][4][5][6][7] Four linear inert metal electrodes embedded within a rectangular sample as shown in Fig. 1 can be fabricated if the sample has a relatively low melting temperature, or if it is polycrystalline, i.e., a ceramic, material.…”
Section: Introductionmentioning
confidence: 99%
“…Because needle-like samples were used in our measurements, influences of the contact arrangement are expected to be negligible [12]. Furthermore, due to the geometry of the samples, concentration gradients parallel to the length axis are very unlikely to occur between the contacts for the voltage drop measurement.…”
Section: The Rate Constant Kin This Expression Ismentioning
confidence: 99%