EFFECTS OF Cr UNDERLAYERS AND CoCr THICKNESS ON THE COERCIVITY AND THE MAGNETIZATION REVERSAL MECHANISMS IN CoCr/Cr FILMS

Abstract

Abstract---The magnetization reversal mechanisms in RF sputtered CoCr films with and without Cr underlayers have been investigated by measuring the angular dependence of the coercivity and hysteresis loss. Peak coercivity angles were observed to shift downward as the CoCr film thickness was increased for no Cr underlayers, and the shift direction was reversed with a thick Cr underlayer. Moreover, it was found that the Cr underlayers changed the magnetization reversal mechanism from domain wall motion to incoherent curling rotation in the thin CoCr films while the Cr underlayers had little influence on the switching modes in thick CoCr films.

Thickness dependence of structural, magnetic properties and reversal mechanism of Co–Cr–Ta/Cr longitudinal recording media

“…The inplane coercivity H cO reaches a maximum when the thickness is 20 nm and monotonously decreases at larger thickness. This kind of behavior has been reported elsewhere [3][4][5]. In contrast, perpendicular coercivity H c> increases with increasing Co-Cr-Ta thickness.…”