2015
DOI: 10.1088/2053-1591/2/5/055005
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Effects of current on early stages of focused ion beam nano-machining

Abstract: In this report we investigate the effects of focused ion beam (FIB) machining at low doses in the range of 10 15 ions/cm 2 to 10 16 ions/cm 2 for currents below 300 pA on Si(100) substrates. The effects of similar doses with currents in the range 10pA to 300 pA were compared. The topography of resulting structures has been characterized using atomic force microscope, while crystallinity of the Si was assessed by means of Raman spectroscopy. These machining parameters allow a controllable preparation of structu… Show more

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Cited by 10 publications
(16 citation statements)
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“…Implanted Ga ions would modify the surface tension value and disrupt the atomic structure of the Au bulk, which could explain the significantly reduced elastic moduli calculated above. Under the experimental conditions employed in this work, the range of Ga implantation into a surface will be ~10 nm from the target location, approximated by a sum of Gaussian density distributions [14,15]. Hence, all of the experimental NWBs will all contain some implanted gallium atoms.…”
Section: Effects Of Ga Implantationmentioning
confidence: 99%
“…Implanted Ga ions would modify the surface tension value and disrupt the atomic structure of the Au bulk, which could explain the significantly reduced elastic moduli calculated above. Under the experimental conditions employed in this work, the range of Ga implantation into a surface will be ~10 nm from the target location, approximated by a sum of Gaussian density distributions [14,15]. Hence, all of the experimental NWBs will all contain some implanted gallium atoms.…”
Section: Effects Of Ga Implantationmentioning
confidence: 99%
“…Surface topography measurement also detects the marks left on a specimen in trying to achieve the shape, such as those created by machining or polishing. Surface metrology is also highly relevant to nanotechnology and micro/nanofabrication, for example assessing the structure of thin films manufactured using vapour deposition [2][3][4], or using focused ion beam to etch surfaces [5][6]. Researchers in these fields represent a range of scientific and engineering disciplines, and hence may be unfamiliar with the complexities of measuring surface topography.…”
Section: Introductionmentioning
confidence: 99%
“…Laser ablation compared to lithography/e-beam milling for fabrication of micro/nano structures is known as a faster method, moreover, it requires less number of processing steps. 9,10 Laser ablation has been utilized to create optical devices operating in the visible region. 11,12 Direct laser writing procedures have low energy requirements and rapid production times not only for 1D but also for 2D nanostructures.…”
Section: Introductionmentioning
confidence: 99%