2009
DOI: 10.1103/physrevb.80.085302
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Effects of disorder on the current density and recombination profile in organic light-emitting diodes

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Cited by 43 publications
(41 citation statements)
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“…Moreover, "behind" the recombination zone the mobility of charge carriers of one type decreases further due to their now very strongly reduced density. 27 According to the present work, an additional reduction in the carrier mobilities in and behind the recombination zone should occur by the increased effective disorder due to the random Coulomb field of the carriers of the opposite sign. This should lead to a further reduction in the calculated width of the recombination zone.…”
Section: Discussionmentioning
confidence: 99%
“…Moreover, "behind" the recombination zone the mobility of charge carriers of one type decreases further due to their now very strongly reduced density. 27 According to the present work, an additional reduction in the carrier mobilities in and behind the recombination zone should occur by the increased effective disorder due to the random Coulomb field of the carriers of the opposite sign. This should lead to a further reduction in the calculated width of the recombination zone.…”
Section: Discussionmentioning
confidence: 99%
“…The recombination rate at zero field is described by the Langevin formula, whereas for finite fields an extension of that formula as described in Ref. 39 is used. Based on the results obtained in Refs.…”
Section: Introductionmentioning
confidence: 99%
“…For calculating the current density and the exciton-formation profile, we employ a recently developed one-dimensional drift-diffusion OLED device model. 39 The model is based on the experimentally determined (unipolar) hole 40 and electron 41 mobility functions. The recombination rate at zero field is described by the Langevin formula, whereas for finite fields an extension of that formula as described in Ref.…”
Section: Introductionmentioning
confidence: 99%
“…8 In order to investigate the effect of this space charge on the EA signal, as a first step the position-dependent electric field F͑x͒ is calculated as a function of the voltage, using the drift-diffusion model given in Ref. 29. Figure 4͑a͒ shows results for a 122 nm thick PF-TAA layer, for three values of the voltage.…”
Section: Experimental Results and Analysismentioning
confidence: 99%