We present a mechanism for the recently discovered magnetoresistance in disordered pi-conjugated materials, based on hopping of polarons and bipolaron formation, in the presence of the random hyperfine fields of the hydrogen nuclei and an external magnetic field. Within a simple model we describe the magnetic field dependence of the bipolaron density. Monte Carlo simulations including on-site and longer-range Coulomb repulsion show how this leads to positive and negative magnetoresistance. Depending on the branching ratio between bipolaron formation or dissociation and hopping rates, two different line shapes in excellent agreement with experiment are obtained.
We present a theory for spin diffusion in disordered organic semiconductors, based on incoherent hopping of a charge carrier and coherent precession of its spin in an effective magnetic field, composed of the random hyperfine field of hydrogen nuclei and an applied magnetic field. From Monte Carlo simulations and an analysis of the waiting-time distribution of the carrier we predict a surprisingly weak temperature dependence, but a considerable magnetic-field dependence of the spin-diffusion length. We show that both predictions are in agreement with experiments on organic spin valves.
Accurate modeling of electron-hole recombination in organic light-emitting diodes ͑OLEDs͒ is essential for developing a complete description of their functioning. Traditionally, the recombination rate is described by the Langevin formula, with a proportionality factor equal to the sum of the electron and hole mobilities. In the disordered organic semiconductors used in OLEDs these mobilities have been shown to depend strongly on the carrier densities and on the electric field. Moreover, the energetic disorder leads to percolating pathways for the electron and hole currents, which may or may not be correlated. To answer the question whether the Langevin formula is still valid under such circumstances we perform Monte Carlo simulations of the recombination rate for Gaussian energetic disorder. We vary the disorder energy, the temperature, the densities, and mobility ratio of electrons and holes, the electric field, and the type of correlation between the electron and hole energies. We find that at zero electric field the Langevin formula is surprisingly well obeyed, provided that a change in the charge-carrier mobilities due to the presence of charge carriers of the opposite type is taken into account. Deviations from the Langevin formula at finite electric field are small at the field scale relevant for OLED modeling.
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