The predictive accuracy of state-of-the-art continuum models for charge transport in organic semiconductors is highly dependent on the accurate tuning of a set of parameters whose values cannot be effectively estimated either by direct measurements or by first principles. Fitting the complete set of model parameters at once to experimental data requires to set up extremely complex multi-objective optimization problems whose solution is, on the one hand, overwhelmingly computationally expensive and, on the other, it provides no guarantee of the physical soundness of the value obtained for each individual parameter. In the present study we present a step-by-step procedure that enables to determine the most relevant model parameters, namely the density of states width, the carrier mobility and the injection barrier height, by fitting experimental data from a sequence of relatively simple and inexpensive measurements to suitably devised numerical simulations. At each step of the proposed procedure only one parameter value is sought for, thus highly simplifying the numerical fitting and enhancing its robustness, reliability and accuracy. As a case study we consider a prototypical n-type organic polymer. A very satisfactory fitting of experimental measurements is obtained, and physically meaningful values for the aforementioned parameters are extracted.Organic semiconductors are an outstanding candidate for becoming the material platform for the development of large-area, low cost, flexible electronics 1 . Since they can be processed from solution, they can be formulated as functional inks and deposited by means of printing techniques adapted from graphical arts (ink-jet, screen printing, spray coating, flexography to cite but a few) 2 . Their electronic performance has been constantly improving over the years leading to devices which compare well to, or even outperform, those based on amorphous silicon. Despite this technological progress, many fundamental questions are still debated and there is a strong need for simple yet reliable approaches to extract physical parameters from experimental measurements 3 .Recently we have shown that, by fitting Capacitance-Voltage (CV) measurements of Metal-InsulatorSemiconductor (MIS) capacitors, it is possible to extract the width of the Density of States (DOS) -assuming it is a superposition of Gaussian functions -exploiting the sensitivity of CV curves to the semiconductor disorder degree 4, 5 . By operating MIS capacitors at suitably low frequency, quasi-equilibrium is ensured which implies that simulations can be performed in the static regime and that phenomena specifically related to carrier transport are negligible in order to fit experimental measurements, which leads to advantages in terms of both computational cost and accuracy. In addition, the DOS extraction is disentangled from carrier transport properties, which makes the fitting procedure substantially simpler and more robust.If a DOS consisting of a single Gaussian provides a reasonable fit, the carrier mobility ...