Effects of interface area density and solid solution on the microhardness of Cu-Nb microcomposite wires

Texture Evolution and Nanohardness in Cu-Nb Composite Wires

“…Instead of Cu grain boundaries, a high density of Cu-Nb interfaces were created in the Cu 4 +Nb region. Such interfaces often play an important role in determining the properties of composite materials [1,19,41,42] and are especially important in composites with nanoscale microstructures, since a large number of defects are present [43,44]. Misfit dislocations and vacancies can act as obstacles for dislocation movement and are ideal sinks for dislocation annihilation [44].…”

“…The large number of embedded Nb fibers affects the deformation and texture development of the Cu matrix [18]. A variety of constraints, including the Cu-Nb interface area and the matrix dimensions, will alter the deformation compared to non-composite FCC materials [19]. It is well established that the texture exerts a strong influence on the mechanical properties and electrical conductivity of such materials.…”

“…The microstructure and texture evolution of Cu-Nb microcomposites have been widely investigated [6,8,19,[23][24][25][26]. Using X-ray diffraction (XRD) and neutron diffraction, researchers [6,23,25] observed that a sharp <111> fiber texture with a weak <100> texture for the Cu matrix and a distinct <110> texture for Nb developed in these composite wires.…”

“…However, it is impossible to characterize the texture at different scales in the Cu matrix by XRD. Several studies [19,26] utilized TEM to investigate the crystallographic relationship between the Cu matrix and Nb fibers. Deng et al [19] reported that a comparatively parallel relationship of <111> Cu and <110> Nb with a few degrees of deviation formed in Cu-Nb wires at a strain of 24.8.…”

“…Several studies [19,26] utilized TEM to investigate the crystallographic relationship between the Cu matrix and Nb fibers. Deng et al [19] reported that a comparatively parallel relationship of <111> Cu and <110> Nb with a few degrees of deviation formed in Cu-Nb wires at a strain of 24.8. Nevertheless, the texture obtained by TEM did not support this result statistically.…”