1994
DOI: 10.1088/0963-0252/3/3/017
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Effects of plasma processing on the microstructural properties of silicon powders

Abstract: The effects of plasma processing conditions on the microstructural properties of silicon powders are presented. Hydrogenated nanophase silicon powden were preparedming low-pressure and low-temperature square wave modulated RF plasma (1 3.56 MHz) using pure Silane gas. Plasma parameters such as pressure, RF power, plasma modulation frequency, and gas flow rate were varied.In situ analysis by quadrupoiar mass spectroscopy and ex situ analysis of the silicon powders by Fourier transform infrared spectroscopy ( F … Show more

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Cited by 38 publications
(20 citation statements)
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“…The usual growing conditions and structure are described elsewhere. 32 Typical particle diameters are much smaller than 100 nm. They have a high hydrogen concentration ͑Ͼ30% ͒ and a residual amount of oxygen that is incorporated when the reaction chamber is opened to the air.…”
Section: Methodsmentioning
confidence: 99%
“…The usual growing conditions and structure are described elsewhere. 32 Typical particle diameters are much smaller than 100 nm. They have a high hydrogen concentration ͑Ͼ30% ͒ and a residual amount of oxygen that is incorporated when the reaction chamber is opened to the air.…”
Section: Methodsmentioning
confidence: 99%
“…4 The microelectronics industry is concerned that the general trend of reduction of the device dimensions may be limited by the particle contamination from the plasma process itself. Nowadays, the undesirable role of the particles during the plasma processing has been questioned because the new properties found in silicon powders 5,6 and in the silicon films 7 grown in the presence of particles can be used in possible future applications as nanostructured materials. [5][6][7][8] In earlier studies on hydrogenated amorphous silicon (a-Si:H) thin films produced by PECVD, the powder formation was correlated to a deterioration of the film quality due to the production of pinholes, roughness, and porosity.…”
Section: Introductionmentioning
confidence: 99%
“…Nowadays, the undesirable role of the particles during the plasma processing has been questioned because the new properties found in silicon powders 5,6 and in the silicon films 7 grown in the presence of particles can be used in possible future applications as nanostructured materials. [5][6][7][8] In earlier studies on hydrogenated amorphous silicon (a-Si:H) thin films produced by PECVD, the powder formation was correlated to a deterioration of the film quality due to the production of pinholes, roughness, and porosity. 9 Later, however, a study on the increase in the deposition rate and the decrease in the substrate temperature of silicon thin films 10 concluded that the film properties were improved, in spite of the presence of powder during the plasma process.…”
Section: Introductionmentioning
confidence: 99%
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“…3 Transmission electron microscopy observations 11 have revealed that the particles are mostly spherical with mean 20 nm diameter whereas electron diffraction patterns show that they are amorphous. Another important structural characteristic is their high hydrogen content that comes from the silane precursor gas.…”
mentioning
confidence: 99%