2011
DOI: 10.1016/j.jallcom.2011.02.127
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Effects of sputtering pressure and post-metallization annealing on the physical properties of rf-sputtered Y2O3 films

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Cited by 10 publications
(3 citation statements)
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“…It was considered that refractive index ( n ) is related to packing density of the film. The Drude equation 43,44 was usually used to confirm the above analysis where p is the mean value of the porosity, n f is refractive index of porous materials, n b is the refractive index of bulk materials. The refractive index ( n b ) of ZnO bulk is 2·008 at 633 nm.…”
Section: Resultsmentioning
confidence: 99%
“…It was considered that refractive index ( n ) is related to packing density of the film. The Drude equation 43,44 was usually used to confirm the above analysis where p is the mean value of the porosity, n f is refractive index of porous materials, n b is the refractive index of bulk materials. The refractive index ( n b ) of ZnO bulk is 2·008 at 633 nm.…”
Section: Resultsmentioning
confidence: 99%
“…For example, it has been shown that a low oxygen partial pressure and reaction temperature tend to make the film in an oxygen-deficient environment, which favors the growth of the monoclinic phase rather than the cubic phase [9,19,21,22]. Nevertheless, Y 2 O 3 films, regardless of their as-deposited structure, will transform to the cubic phase at an elevated temperature [23][24][25][26].…”
Section: Introductionmentioning
confidence: 99%
“…Y 2 O 3 is an important material for optical applications because of its excellent optical and mechanical properties including a wide transmission window from 250 nm to about 8 lm [13,14]. Y 2 O 3 films have been deposited and characterized using many techniques for different purposes [15,16]. Zhang et al [17] found that the hardness of ZnS coated with Y 2 O 3 and SiO 2 multilayer increased from 250 to 430 kg/mm 2 and the transmittance increased from 63% to 83% at 3-5 lm.…”
Section: Introductionmentioning
confidence: 99%