Raman scattering and photoluminescence spectroscopy are used to investigate the optical properties of single layer black phosphorus obtained by mechanical exfoliation of bulk crystals under an argon atmosphere. The Raman spectroscopy, performed in situ on the same flake as the photoluminescence measurements, demonstrates the single layer character of the investigated samples. The emission spectra, dominated by excitonic effects, display the expected in plane anisotropy. The emission energy depends on the type of substrate on which the flake is placed due to the different dielectric screening. Finally, the blue shift of the emission with increasing temperature is well described using a two oscillator model for the temperature dependence of the band gap.Black phosphorus, the most stable of all the allotropes of phosphorus, has been intensively studied by different experimental methods from the early fifties of the last century.1-7 Bulk black phosphorus is a semiconductor, with a band gap of about 0.335 eV.1,4 The orthorombic bulk crystal has a layered structure, with atomic layers bound by weak van der Waals interactions. A single atomic layer is puckered, with the phosphorus atoms being parallel in the (010) plane. 3,8,9 Atomically thin monolayers have been recently isolated using mechanical exfoliation, 10 adding black phosphorus to the rapidly growing family of emerging two dimensional materials. The band gap of black phosphorus is always direct and can be tuned from 0.3 eV to the nearly visible part of the spectrum 11,12 . In contrast, graphene is gapless, 13 and the transition metals dichalcogenides (TMDs) have an indirect gap in bulk phase and only monolayer TMDs have a direct gap.14 Moreover, black phosphorus exhibits a strong in-plane anisotropy 11,12,[15][16][17] , absent in graphene and TMDs. Additionally, the relatively high mobilities measured at room temperature combined with the direct band gap result in an on/off ratio for FET transistors of the order of 10 5 . 26 The exciton binding energy and consequently the emission energy strongly depend on the dielectric environment (substrate) 10,27 . This could partially explain the wide range of values for the black phosphorus emission energy found in the literature, possibly related also to a slightly different composition of the SiO 2 substrates employed. Moreover, owing to the limited life time of the samples, the various characterization techniques used to identify monolayer black phosphorus (e.g. atomic force microscopy, Raman spectroscopy) could not always be performed on the same flake where the optical response was investigated.In this paper we present a systematic investigation of the optical properties of monolayers of black phosphorus. We analyze the properties of the emission as a function of the dielectric constant of the substrate, excitation power, polarization and temperature. The single layer character of the investigated flakes is demonstrated using in situ Raman measurements on the same flake used for the PL. We show that the PL emission ...