1998
DOI: 10.1088/0960-1317/8/2/014
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Effects of the etchmask properties on the anisotropy ratio in anisotropic etching of silicon in aqueous KOH

Abstract: The objective of the present study is to investigate the influence of the etchmask properties on anisotropic etching of silicon in a KOH/H 2 O solution. The mechanical stress induced in the silicon substrate by an LPCVD-Si 3 N 4 etchmask has been analysed by 3D finite element analysis. It is shown that the rise of the mechanical stress at the edges of etchmask openings is mainly affected by the thickness of the LPCVD-Si 3 N 4 etchmask. The effect of the mechanical stress on the anisotropy ratio was experimenta… Show more

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Cited by 17 publications
(15 citation statements)
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“…The stability of the pyramidal hillocks is probably related to the presence of slow etching Si(1 1 1) planes limiting the pyramid sides [7,[48][49][50][51]. In what follows the etching surface is modelled considering a (1 0 0) surface exposing (1 1 1) planes [52] (see Fig.…”
Section: Estimation Of the Steady-state Height Of Micro-pyramidsmentioning
confidence: 99%
“…The stability of the pyramidal hillocks is probably related to the presence of slow etching Si(1 1 1) planes limiting the pyramid sides [7,[48][49][50][51]. In what follows the etching surface is modelled considering a (1 0 0) surface exposing (1 1 1) planes [52] (see Fig.…”
Section: Estimation Of the Steady-state Height Of Micro-pyramidsmentioning
confidence: 99%
“…[1][2][3] For ͑100͒-oriented wafers, widely used in MEMS technology, the ratio of the etch rates of ͑111͒ and ͑100͒ faces, referred to here as the anisotropic ratio, is of vital importance for making high-resolution micromechanical structures. Although in the most favorable case the anisotropic ratio can exceed 100, 4 control and reproducibility at this level are poor. The composition of the etchant and the etching conditions as well as the ͑mis͒orientation of both the wafer surface and the mask edge are clearly important.…”
mentioning
confidence: 99%
“…Other factors which may play a role are dislocations in the silicon, defects at the silicon-mask interface, and impurities ͑even at very low concentrations͒ in the etchant. 4 Because of the practical importance of etching anisotropy, extensive studies have been devoted to mapping the etch rates of the various crystallographic faces of silicon in different alkaline etchants. Two experimental approaches have been used.…”
mentioning
confidence: 99%
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“…3). The actual instability has geometric reasons, but it can be enhanced by the mechanical stresses, which are induced into the silicon substrate by the possibly stressed etch mask materials [42]. This is the starting point of the "peeling" of the first (111) plane at the beginning of the etch attack.…”
Section: Step Flow Model Of 3-d Structuringmentioning
confidence: 99%