2014
DOI: 10.1016/j.msea.2014.06.102
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Effects of thermal annealing in the post-reflow process on microstructure, tin crystallography, and impact reliability of Sn–Ag–Cu solder joints

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Cited by 18 publications
(3 citation statements)
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“…These complicated interfacial behaviors are an important issue for the solder joint reliability. When the solder joints are subjected to the subsequent thermal aging, excessive IMC formation may degrade the mechanical strength of solder joints due to the brittle nature of IMC [9].…”
Section: Introductionmentioning
confidence: 99%
“…These complicated interfacial behaviors are an important issue for the solder joint reliability. When the solder joints are subjected to the subsequent thermal aging, excessive IMC formation may degrade the mechanical strength of solder joints due to the brittle nature of IMC [9].…”
Section: Introductionmentioning
confidence: 99%
“…The alloy prepared at 6 h milling time has the grain size of 100 µm, lower than the starting grain size (120−140 µm). The remarkable microstructure obtained after annealing is due to the dissolution of the residual stress caused by MA [7].…”
Section: Resultsmentioning
confidence: 99%
“…The use of lead-free solders has become common in electronic packaging industry due to environmental considerations [1.2] Among various lead-free solders available, high-Ag-content Sn-Ag-Cu alloys such as Sn-4wt.% Ag-0.5wt.% Cu (SAC405) or Sn-3wt.% Ag-0.5wt.% Cu (SAC305) are considered the most promising replacement of Sn-Pb solders, and are widely used as lead-free solutions for BGA interconnects [3][4][5]. However, the high rigidity of the high-Ag-content Sn-Ag-Cu solder joints causes drop-induced failures for portable electronics during normal or excessive use conditions.…”
Section: Introductionmentioning
confidence: 99%