Effets de contraste cristallin en microscopie électronique à balayage

Philibert, J.; Tixier, R.

doi:10.1016/0047-7206(69)90018-1

Cited by 15 publications

(7 citation statements)

References 8 publications

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“…Scanning electron microscopy may be applied for observing such a stray field arising from a micro specimen surface. The criteria of equation (a), (6), and (9) are important clues for experiments in detecting the stray field.…”

Section: Discussionmentioning

confidence: 99%

Magnetic contrast in secondary electron images of uniaxial ferromagnetic materials obtained by scanning electron microscopy

Yamamoto

Tsuno

1975

Phys. Stat. Sol. (a)

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Section: Discussionmentioning

confidence: 99%

Magnetic contrast in secondary electron images of uniaxial ferromagnetic materials obtained by scanning electron microscopy

Yamamoto

Tsuno

1975

Phys. Stat. Sol. (a)

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“…The low-loss arrangement is also advantageous for the so-called "type 2 magnetic contrast" (Philibert and Tixier 1969, Fathers et al1973 a, b, 1974. Contrary to the type 1 magnetic contrast arising from the deflection of low energy secondary electrons in the external magnetic stray fields of a magnetic specimen, the type 2 magnetic contrast arises from the deflection of the trajectories of high energy electrons by the fields inside the magnetized specimen because of the Lorentz force.…”

Section: Low-loss Image Type 2 Magnetic Contrastmentioning

confidence: 99%

Physical background of electron backscattering

Niedrig

1978

Scanning

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The parameters governing electron backscattering from thin films and from bulk solids are reviewed: Atomic scattering cross‐section, atomic number, single/multiple scattering, film thickness, scattering angular distribution, angle of incidence, diffraction effects. Their influence on some important contrast mechanisms due to backscattered electrons in scanning electron microscopy (thickness contrast, Z/material contrast, tilting/topography contrast, crystal orientation contrast) is discussed. The most frequently used backscattering electron detection systems are briefly described.

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“…(3) If a sample with a strong internal magnetic field and cubic crystal symmetry (such as iron) is examined correctly by the backscattered electron imaging method, then the domains can be seen by type-2 magnetic contrast (Philibert & Tixier, 1969;Gervais etal., 1973;Fathers et al, 1973;Shimizu et al, 1974;Yamamoto, 1976;Tsuno et al, 1981).…”

Section: Introductionmentioning

confidence: 99%

Some theoretical aspects of type‐1 magnetic contrast in the scanning electron microscope

Wells

1985

Journal of Microscopy

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KEY WORDS. Difference image, fluxon unit, Fourier methods, Gauss' theorem, Heisenberg uncertainty principle, magnetic induction, magnetic recording head, magnetic tape, Neumann's problem, quantum limit, scanning electron microscope (SEM), secondary electrons (SE), uniaxial magnetic material, uniqueness theorem for magnetic fields. SUMMARY Type-1 magnetic contrast can be obtained in the secondary electron (SE) image in the SEM from a sample having an external magnetic field if the SE detector is directionally sensitive. Gauss' theorem is applied to show that the normal component of induction at the surface of the sample can be calculated from the measured spatial derivative(s) of the SE difference-signal. A method is given in this paper for calculating the three components of the induction in the entire volume above the sample surface. Reasons are given for believing that type-1 magnetic contrast is limited in spatial resolution by the fluxon unit.

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Effets de contraste cristallin en microscopie électronique à balayage

Cited by 15 publications

References 8 publications

Magnetic contrast in secondary electron images of uniaxial ferromagnetic materials obtained by scanning electron microscopy

Magnetic contrast in secondary electron images of uniaxial ferromagnetic materials obtained by scanning electron microscopy

Physical background of electron backscattering

Some theoretical aspects of type‐1 magnetic contrast in the scanning electron microscope

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