Magnetic contrast in secondary electron images of uniaxial ferromagnetic materials obtained by scanning electron microscopy

Abstract

The minimum observable width of magnetic contrast in a secondary electron image of a uniaxial ferromagnetic material is approximately evaluated as a function of saturation magnetization. The observed width is in general agreement with that one evaluated, and the unobservable magnetic contrast in thin films is also studied.

On the quality of type 1 magnetic contrast obtained in the scanning electron microscope

“…So far as is known, no group has yet attempted to find these limits and the dearth of results should not be taken as negative proof. Unlike Yaniamoto and Tsuno [5] however, who were not able to detect magnetic contrast in Ga-substituted YIG ( M , = 16 G) we have resolved 10 pm stripe domains in a garnet epilayer. Fig.…”

Domain observation in MnBi films with the scanning electron microscope

“…The stray field H,(x, z) from a single layer of charge forming a stripe pattern parallel to the y-axis (Yamamoto and Tsuno 1975)…”

Magnetic domains of single-crystal Nd2Fe14B imaged by unmodified scanning electron microscopy

“…In this manner the intensity of domain contrast varies from a maximum to a minimum across a single domain. 3,4 The domain contrast obtained by SEM is highly influenced by the surface morphology, because secondary electrons also give rise to a topographical image. In order to insure that the crystal surfaces were as smooth as possible, the specimen was mounted in a Gatan dual ion mill on a special sample holder to accommodate its thickness.…”