The full energy peak efficiency (FEPE) determined by
experimental or Monte Carlo (MC) simulation methods is a very
important parameter in HPGe detectors. Since FEPE depends on the
detector's geometric parameters, the parameters provided by the
manufacturer are of great importance in modeling the detector with
the MC method. The most important reason for the discrepancy between
MC and experimental calculations is the lack of accurate information
about the detector's geometric properties. The thickness of the
copper contact pin in the middle of the detector hole is not given
by the manufacturer. In this study, the effect of copper contact pin
thickness on detector efficiency was investigated by using the PHITS
3.24 MC simulation program both at different copper contact pin
radii and at different detector-source distances. The efficiency
values were calculated for photons in the energy range of
59.5 keV-1408 keV, at 4 different distances, namely 5 cm,
13.25 cm, 15 cm, and 20 cm and for the radii of copper contact
pins increased from 1 mm to 3.5 mm at 0.5 mm intervals. According
to the results, it has been determined that the presence of copper
contact pins causes a change in detector efficiency up to 1.9%,
especially in the high energy region, and has no effect on the
detector efficiency in the low energy region. In addition, it has
been observed that the effect of copper contact pin thickness on
detector efficiency is almost independent of the source-detector
distance.