Efficient Spectral Techniques for Sequential ATPG

Giani, A.; Sheng, Shuo; Hsiao, Michael S.; Agrawal, Vishwani D.

doi:10.1007/978-1-4020-6488-3_33

Cited by 5 publications

(15 citation statements)

References 9 publications

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“…Hence, in many cases LFSR selection is not optimal [1,3]. In series of the papers, from which the first was [4], the authors proposed the new spectral technique of the test generation. In the first step, the set of randomly generated testing vectors is completed.…”

Section: Motivatonsmentioning

confidence: 99%

“…The greater distance between two consecutives states means that these states are well matched to testing process. The Hamming distance between two binary vectors can be calculated immediately from the Walsh transform [5,6], what will be considered in the next part of the paper, -during testing, control states (FFs) have hard access to hard detected faults [3,4], hence testing of such circuits can be difficult, -the best former test patterns do not guarantee that later test patterns will be also the best [4]. is the vector of spectral coefficients called the spectrum of the function f [5,6,9].…”

Section: Short Analysis Of the Lfsr Propertiesmentioning

confidence: 99%

“…The main idea of the algorithm was taken from [4] but some additional modifications were introduced, hence efficiency of the algorithm was significantly improved. Let s be a length of the sequences i=1,…,n.…”

Section: Algorithm 2 Generation Of the New Vectors Based On Their Spementioning

confidence: 99%

See 2 more Smart Citations

Spectral Modification of the LFSR - Sequence for Test Patterns Generation Improvement

Porwik

Wróbel

2007

2007 14th International Conference on Mixed Design of Integrated Circuits and Systems

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In the paper some modification of the LFSR sequences was proposed. Modified, predictable test pattern sequences are estimated on the basis of spectral analysis of the past sequences. Experimental results show that the number of the test vectors can be significantly reduced if classical LFSR register approach by spectral analysis will be aided. Obtained results of benchmarks circuits testing demonstrate the effectiveness of the proposed technique in which high fault coverage was achieved.

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Section: Motivatonsmentioning

confidence: 99%

Section: Short Analysis Of the Lfsr Propertiesmentioning

confidence: 99%

See 1 more Smart Citation

Spectral Modification of the LFSR - Sequence for Test Patterns Generation Improvement

Porwik

Wróbel

2007

2007 14th International Conference on Mixed Design of Integrated Circuits and Systems

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“…Here, genetic algorithm based methods have been widely used [3,4,5]. Recently, efficient results have been obtained by spectral methods [6]. The approaches belonging to this class are fast for smaller circuits only but become ineffective when number of primary inputs and the sequential depth of the circuit increase.…”

Section: Introductionmentioning

confidence: 99%

High-Level Decision Diagram based Fault Models for Targeting FSMs

Raik

Ubar

Viilukas

2006

9th EUROMICRO Conference on Digital System Design (DSD'06)

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Recently, a number of works have been published on implementing assignment decision diagram models combined with SAT methods to address register-transfer level test pattern generation. Those methods have proven efficient. However, all of them target modules inside the datapath of the circuit. In this paper, we show by experiments that the fault coverage achieved by full datapath tests is often lower than what can be achieved if faults in the control part FSM were additionally considered. We also propose a new type of fault model for targeting faults in FSMs embedded to RTL descriptions. In addition, we present an alternative for traditional assignment decision diagrams, which provides for a more general representation of RTL circuits. We show that our model, called high-level decision diagrams, allows efficient high-level test path activation. According to experiments the proposed approach outperforms state-ofthe-art test pattern generation tools.

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“…But often, values required on DFFs for exciting/propagating many fault effect(s) are very difficult to achieve in the functional mode. In [5], [6], [7] and [8], the authors have proposed novel sequential ATPG (Automatic Test Pattern Generation) algorithms targeted to improve the fault coverage of sequential circuits. Their results show that achieving a high level of fault coverage for sequential circuits is still a major problem, especially for large circuits with huge state spaces.…”

Section: Introductionmentioning

confidence: 99%

Design-for-test methodology for non-scan at-speed testing

Banga

Rahagude

Hsiao

2011

2011 Design, Automation &Amp; Test in Europe

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While scan-based testing achieves a high fault coverage, it requires long test application times and substantial tester memory, in addition to the overhead in chip area and high test power. Functional testing, on the other hand, suffers from low coverage but can be applied at-speed. In this paper, we propose a novel three-step design-for-test (DFT) methodology which enhances the performance of functional testing to a great extent. In the first step we expand the state space of the circuit beyond functionally reachable space without scan or reset. These new states create conditions to activate/propagate fault effects that are otherwise hard-to-detect. Since structural correlation between D flip-flops (DFFs) of a circuit restricts its state space variation, the second step consists of partitioning the DFFs into different groups that helps to break such correlations. In the third step, we make internal hard-to-observe points in the circuit more observable by directly XORing them with selected primary outputs. This method can be applied at-speed (since no scan shifting is involved) saving significant amount of test application time, with comparable area overhead as scan-based DFT. Our experiments on large ISCAS'89 and ITC'99 benchmarks show that we are able to achieve very high non-scan fault coverages while simultaneously reducing the test application time (114×) as compared to scan based techniques.

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Efficient Spectral Techniques for Sequential ATPG

Cited by 5 publications

References 9 publications

Spectral Modification of the LFSR - Sequence for Test Patterns Generation Improvement

Spectral Modification of the LFSR - Sequence for Test Patterns Generation Improvement

High-Level Decision Diagram based Fault Models for Targeting FSMs

Design-for-test methodology for non-scan at-speed testing

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