2014
DOI: 10.1109/tcad.2014.2299957
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Efficient Statistical Model Checking of Hardware Circuits With Multiple Failure Regions

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Cited by 6 publications
(1 citation statement)
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“…However, this method cannot obtain rare attribute samples. For the low-probability attributes of hardware circuits with multiple failure regions, Kumar et al [41] assumed that the system failure distribution is a Gaussian mixture model, thus proposed to use the variational Bayes method to learn an optimal importance sampling distribution from the Gaussian mixture model. However, the optimal importance sampling distribution is not a distribution family from the system path space.…”
Section: Related Workmentioning
confidence: 99%
“…However, this method cannot obtain rare attribute samples. For the low-probability attributes of hardware circuits with multiple failure regions, Kumar et al [41] assumed that the system failure distribution is a Gaussian mixture model, thus proposed to use the variational Bayes method to learn an optimal importance sampling distribution from the Gaussian mixture model. However, the optimal importance sampling distribution is not a distribution family from the system path space.…”
Section: Related Workmentioning
confidence: 99%