Proceedings of the 49th Annual Design Automation Conference 2012
DOI: 10.1145/2228360.2228563
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Efficient trimmed-sample Monte Carlo methodology and yield-aware design flow for analog circuits

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Cited by 8 publications
(1 citation statement)
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“…This small variation is 1σ of each distribution nominal value. After obtaining the effect of each variation on the performance parameters, a linear model estimates roughly the output distance of each sample performance from the minimum desired one; consequently, the design points whose performance do not meet the minimum requirement cannot pass this phase . Over the next phase, MC simulation is run just on the practical solutions in each generation, and impractical solutions do not emerge between the final results.…”
Section: Main Structure Of the Proposed Algorithmmentioning
confidence: 99%
“…This small variation is 1σ of each distribution nominal value. After obtaining the effect of each variation on the performance parameters, a linear model estimates roughly the output distance of each sample performance from the minimum desired one; consequently, the design points whose performance do not meet the minimum requirement cannot pass this phase . Over the next phase, MC simulation is run just on the practical solutions in each generation, and impractical solutions do not emerge between the final results.…”
Section: Main Structure Of the Proposed Algorithmmentioning
confidence: 99%