Eine neue Anordnung für röntgenkristallographische Untersuchungen von Kristallpulver

Bohlin, Helge

doi:10.1002/andp.19203660502

Cited by 67 publications

(9 citation statements)

References 4 publications

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“…1b). This is the prin-ciple of the Seemann-Bohlin parafocusing geometry (Seemann, 1919;Bohlin, 1920). This clearly allows an incident beam from the source placed on the focusing circle, or entering through a narrow slit, at S o , to scatter from a curved sample and come to a focus on the circle at positions D e1 , D e2 etc.…”

Section: Current Methods In Powder Diffractionmentioning

confidence: 99%

A compact high-resolution X-ray powder diffractometer

Fewster¹,

Trout²

2013

J Appl Cryst

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A new powder diffractometer operating in transmission mode is described. It can work as a rapid very compact instrument or as a high-resolution instrument, and the sample preparation is simplified. The incident beam optics create pure Cu K 1 radiation, giving rise to peak widths of $0.1 in 2 in compact form with a sample-to-detector minimum radius of 55 mm, reducing to peak widths of <0.05 in high-resolution mode by increasing the detector radius to 240 mm. The resolution of the diffractometer is shown to be governed by a complex mixture of angular divergence, sample size, diffraction effects and the dimensions of the detector pixels. The data can be collected instantaneously, which combined with trivial sample preparation and no sample alignment, makes it a suitable method for very rapid phase identification. As the detector is moved further from the sample, the angular step from the pixel dimension is reduced and the resolution improves significantly for very detailed studies, including structure determination and analysis of the microstructure. The advantage of this geometry is that the resolution of the diffractometer can be calculated precisely and the instrumental artefacts can be analysed easily without a sample present. The performance is demonstrated with LaB 6 and paracetamol, and a critical appraisal of the uncertainties in the measurements is presented. The instantaneous data collection offers possibilities in dynamic experiments.

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Section: Current Methods In Powder Diffractionmentioning

confidence: 99%

A compact high-resolution X-ray powder diffractometer

Fewster¹,

Trout²

2013

J Appl Cryst

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“…One of the first focusing geometries was published in 1919 by Hugo Seemann [37] * [*Born April 13, 1884 in Celle/Hannover (Germany), died 1974] and in 1920 by Helge Bohlin. [38] They found that if the sample is located along the focusing circle (defined by the focusing points of the X-rays which lie on the focusing circle), they can obtain much sharper diffraction rings. In this special reflection geometry, later called Seemann-Bohlin geometry, the X-ray source and the sample have fixed positions.…”

Section: (B) Development Of Diffraction Geometries and Powder Diffracmentioning

confidence: 99%

A Century of Powder Diffraction: a Brief History

Etter

Dinnebiér

2014

Zeitschrift anorg allge chemie

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Almost a century has passed since the pioneering work of Debye, Scherrer, and Hull and their first powder X-ray diffraction experiments in 1916/17. Although these pioneers and many others discovered most of the fundamental concepts in the field of powder diffraction within the first few years, nobody at that time could foresee the development of the computer and its calculating power in the 21st century. The general availability of computing power changed the field of powder diffraction, as Hugo Rietveld showed with his computerassisted whole powder pattern fitting concept around fifty years after

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“…In (b) the higher annealing temperature has promoted more complete recrystallization instrumental effects (geometry and optical aberrations) from specimen-related effects (phases, and properties thereof). Two optical configurations that are routinely applied for thin-film XRD analysis derive from parafocusing cameras: symmetric Bragg-Brentano geometry 24 and asymmetric Seeman-Bohlin geometry 25,26 (Figure 3). In either optical configuration, the X-ray source intensity and angular dispersion are fixed by the take-off angle from the X-ray source to the entrance slit.…”

Section: X-ray Diffraction (Xrd)mentioning

confidence: 99%

Physical characterization of thin‐film solar cells

Durose¹,

Asher²,

Jaegermann³

et al. 2004

Progress in Photovoltaics

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The principal techniques used in the physical characterization of thin-film solar cells and materials are reviewed, these being scanning probe microscopy (SPM), X-ray diffraction (XRD), spectroscopic ellipsometry, transmission electron microscopy (TEM), Auger electron spectroscopy (AES), secondary-ion mass spectrometry (SIMS), X-ray photoelectron spectroscopy (XPS), photoluminescence and timeresolved photoluminescence (TRPL), electron-beam-induced current (EBIC) and light-beam-induced current (LBIC). For each method the particular applicability to thin-film solar cells is highlighted. Examples of the use of each are given, these being drawn from the chalcopyrite, CdTe, Si and III-V materials systems.

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Eine neue Anordnung für röntgenkristallographische Untersuchungen von Kristallpulver

Abstract: A5 5. ANNALEN DER PHYSIK. VIERTE FOL(fE. BAND 61. 1. Edne neue A n v r h z u n y fdkr r6ntgmk&3tallograpM8che thter8uchz~nyen 210% Erd8taZZpuZve!r1); von HeZge Bohlin.

Cited by 67 publications

References 4 publications

A compact high-resolution X-ray powder diffractometer

A compact high-resolution X-ray powder diffractometer

A Century of Powder Diffraction: a Brief History

Physical characterization of thin‐film solar cells

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