2022
DOI: 10.1016/j.nanoso.2022.100847
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EIS characterization of aging and humidity-related behavior of Bi2Se3 films of different morphologies

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Cited by 8 publications
(9 citation statements)
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“…EIS measurements were performed using the custom system reported in detail elsewhere. 19 The system allowed regulation of the nitrogen gas relative humidity (RH) from 5 to 90%, with a gas flow of up to 1.0 L•min −1 . The relative error in measuring humidity was ±2%.…”
Section: Methodsmentioning
confidence: 99%
“…EIS measurements were performed using the custom system reported in detail elsewhere. 19 The system allowed regulation of the nitrogen gas relative humidity (RH) from 5 to 90%, with a gas flow of up to 1.0 L•min −1 . The relative error in measuring humidity was ±2%.…”
Section: Methodsmentioning
confidence: 99%
“…Overall, the total impedance magnitude was found to be increasing with the increase of the RH level, which is consistent with the behavior previously observed for the partly disordered Bi 2 Se 3 thin films. [ 20 ] For the RH ≤ 60%, the humidity‐related changes of the impedance of the sample were reversible (Figure 6, colored rhombs) and no visual changes in the sample morphology were observed. In turn, testing of the sample at RH 65%–85% resulted in swelling of the sample, followed by its shrinking and irreversible changes in its resistance (Figure 6, hollow rhombs and crosses).…”
Section: Resultsmentioning
confidence: 99%
“…EIS measurements were performed using the custom system reported elsewhere, [ 20 ] which allowed regulating the nitrogen gas RH from 5% to 90%, with a gas flow up to 1.0 L min −1 . The relative error in measuring humidity was ±2%.…”
Section: Methodsmentioning
confidence: 99%
“…The oxidation of the surface of Bi 2 Se 2.975 Te 0.025 most likely is related to the sample handling and storage in the air. [ 25 ] Presumably, the presence of the ≈1–2 nm thin native oxide on the surface of ultrathin films has no negative effect on their TE properties due to the TE properties of these oxides, comparable with the TE properties the not‐oxidized materials. [ 26,27 ] Based on the XPS measurements, the chemical composition of the Te‐doped Bi 2 Se 3 ultrathin film was determined to be Bi (38 ± 4):Se (≈62 ± 4):Te (≈0.6 ± 0.2), which supports the energy‐dispersive X‐ray diffraction measurements.…”
Section: Resultsmentioning
confidence: 99%