1966
DOI: 10.6028/jres.070a.024
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Elastic constants of synthetic single crystal corundum

Abstract: The e lastic cons tan ts of sy nlh e li c sin gle c rys lal co rundum (a luminum ox id e) we re ca lc ulated from o to 900 oK from data ob lai ned by a resu nancc lec hniqu e from 80 to 900 oK.

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Cited by 100 publications
(33 citation statements)
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“…In this case, for Al 2 O 3 [1210], we calculate that ν = 0.0805 [42][43][44] and, thus, flat / free ≈ 1. In this way, can be obtained from a modified Stoney's formula [45] …”
Section: Cantilever Technique and Mel Constant M 2 γ2mentioning
confidence: 97%
See 1 more Smart Citation
“…In this case, for Al 2 O 3 [1210], we calculate that ν = 0.0805 [42][43][44] and, thus, flat / free ≈ 1. In this way, can be obtained from a modified Stoney's formula [45] …”
Section: Cantilever Technique and Mel Constant M 2 γ2mentioning
confidence: 97%
“…Finally, in Eq. (8), C xx is considered temperature independent [42][43][44] and the room temperature value is typically used.…”
Section: Cantilever Technique and Mel Constant M 2 γ2mentioning
confidence: 99%
“…Strain components of sapphire are calculated as functions of the uniaxial stress ͑P͒ by Hook's law by taking elastic compliances of sapphire as S 11 ϭ2.33ϫ10 Ϫ12 m 2 /N, S 12 ϭϪ6.93ϫ10 Ϫ13 m 2 /N. 7 Thus, strain components in GaN induced by the applied stress can be estimated from the strain in sapphire because in-plane deformation of GaN is forced by the deformation of sapphire. It should be noted that the residual strain in the GaN film without applied stress is estimated as ⑀ zz ϭ0.011 by comparing the photoluminescence ͑PL͒ peak energy of the film with reported results in Refs.…”
Section: Reflectance Spectroscopy On Gan Films Under Uniaxial Stressmentioning
confidence: 99%
“…For the backward integrations, elastic sapphire is modeled as hydrodynamic (no strength) using the Mie-Grüneisen EOS referenced to the elastic Hugoniot of Barker and Hollenbach (1970), with Γ 0 =1.5. Thermal softening of the sapphire elastic constants causes at most a 1% change in longitudinal modulus for the temperatures of interest [Tefft, 1966], and was therefore neglected. The drive measurements in Figure 3-17 were on two different anode panels and show slightly different peak stress; it is not known whether such differences arise from anode/cathode misalignment, thermal distortion of the panel assembly, or some combination of the two.…”
Section: Backward-forward Analysis Techniquementioning
confidence: 99%