Elastic properties of epitaxial ZnSe(001) films on GaAs measured by Brillouin spectroscopy

Lee, S.; Hillebrands, B.; Stegeman, George I.; Cheng, Hai‐Ping; Potts, J. E.; Nizzoli, F.

doi:10.1063/1.339892

Cited by 46 publications

(7 citation statements)

References 8 publications

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“…We notice that the BLW and BSW peaks are broadened because the interaction volume is limited by the finite thickness of the films. 36,37 Due to refraction at the air/film interface, the bulk waves associated with the BLW and BSW peaks have a wave vector at angle …”

Section: Bls Experimentsmentioning

confidence: 99%

Mechanical properties of diamond films: A comparative study of polycrystalline and smooth fine-grained diamonds by Brillouin light scattering

Djémia

Dugautier

Chauveau

et al. 2001

Journal of Applied Physics

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Articles you may be interested inBandgap renormalization in titania modified nanostructured tungsten oxide thin films prepared by pulsed laser deposition technique for solar cell applications J. Appl. Phys.Experimental and theoretical study of bulk light scattering in Ca F 2 monocrystals J. Appl. Phys. 98, 053501 (2005); 10.1063/1.2034085Electron field emission properties of gamma irradiated microcrystalline diamond and nanocrystalline carbon thin films Ex situ spectroscopic ellipsometry investigation of the layered structure of polycrystalline diamond thin films grown by electron cyclotron resonance-assisted chemical vapor deposition Effect of nitrogen addition on the microstructure and mechanical properties of diamond films grown using highmethane concentrations Brillouin light scattering, Raman light scattering and x-ray diffraction were used to investigate the elastic and microstructural properties of polycrystalline and smooth fine-grained diamond films of varying diamond quality. They were deposited on a titanium alloy by a two-step microwave plasma-assisted chemical vapor deposition process at 600°C. Their morphology and roughness were studied by scanning electron microscopy and atomic force microscopy. Their refractive indices were determined by the M-line spectroscopy technique. The diamond purity of all these coatings in terms of the sp 3 bonding fraction was deduced from visible and UV Raman spectroscopy as a function of the deposition conditions. All the samples were found to be textured with a ͗011͘ crystallographic direction normal to the film plane, leading to essentially hexagonal symmetry of the elastic tensor. By taking advantage of the detection of a number of different acoustic modes, complete elastic characterization of the films was achieved. The elastic constants C 11 and C 66 , respectively, were selectively determined from the frequency of the longitudinal and shear horizontal bulk modes traveling parallel to the film surface. The three remaining elastic constants, namely, C 44 , C 33 and C 13 , were obtained from detection of the Rayleigh surface wave a bulk shear wave and the bulk longitudinal wave propagating at different angles from the normal to the surface. The values of the elastic constants depend on the deposition conditions and on the microstructural properties of the films, especially the diamond quality and the polycrystalline or smooth fine-grained nature of the diamond. For the polycrystalline diamond film with the best quality, the elastic constants are rather close to the Voigt or Reuss average estimate values using known bulk elastic constants of diamond, whereas those of the smooth fine-grained diamond films are reduced because of the poorer diamond quality leading to lower residual stress in the films.

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Section: Bls Experimentsmentioning

confidence: 99%

Mechanical properties of diamond films: A comparative study of polycrystalline and smooth fine-grained diamonds by Brillouin light scattering

Djémia

Dugautier

Chauveau

et al. 2001

Journal of Applied Physics

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“…In the case of a hexagonal elastic symmetry, four of the five effective elastic constants, namely C 11 , C 13 , C 33 and C 44 , influence the Rayleigh-Sezawa modes, so that they can be evaluated by a best fit procedure of the experimental velocities to the calculated dispersion curves. This procedure has been used in the past for a number of different thin film materials, such as cubic Zinc Selenide [35], hexagonal and cubic Boron Nitride [36][37][38], hexagonal Zinc Oxyde [39], Tin Dioxide [40], Gallium- [32] or Indium- [41] Selenide, and isotropic dielectrics [42][43][44]. In all the above studies it has been put in evidence that the different elastic constants can influence the acoustic modes in a similar way, so that one has to face the problem of the correlation among the fitting parameters.…”

Section: Transparent Films With Deeply Submicrometric Thickness: Dispmentioning

confidence: 99%

Elastic Characterization of Transparent and Opaque Films, Multilayers and Acoustic Resonators by Surface Brillouin Scattering: A Review

Carlotti

2018

Applied Sciences

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There is currently a renewed interest in the development of experimental methods to achieve the elastic characterization of thin films, multilayers and acoustic resonators operating in the GHz range of frequencies. The potentialities of surface Brillouin light scattering (surf-BLS) for this aim are reviewed in this paper, addressing the various situations that may occur for the different types of structures. In particular, the experimental methodology and the amount of information that can be obtained depending on the transparency or opacity of the film material, as well as on the ratio between the film thickness and the light wavelength, are discussed. A generalization to the case of multilayered samples is also provided, together with an outlook on the capability of the recently developed micro-focused scanning version of the surf-BLS technique, which opens new opportunities for the imaging of the spatial profile of the acoustic field in acoustic resonators and in artificially patterned metamaterials, such as phononic crystals.

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“…where a" and a • are the lattice constants parallel and normal to the epitaxial layer and ei~ is the strain tensor. The non-zero components of the strain tensor in thin layers coherently grown on lattice-mismatched (100) substrates are exx = err = e and ezz = [2S12/($11 + Sl 2)] e. Therefore we obtain the difference, Aco, between LO phonon frequencies of strained and strain-free layers from (1) to (5) and the physical values of ZnSe: at 300K co o = 253 cm-1 (Landolt-Brrnstein 1982), S~1 = 2.237 x 10-12 and Sx2 = -0.8623 x 10-12dyn-1cm 2 calculated by elastic constants (Lee et al 1988), p = -4-10 • 1027 and q = -5-94 x 1027 S-2 (Cerdeira et a11972). The value calculated at 300K by assuming that the lattice mismatch between ZnSe and GaAs is accommodated only by uniform deformation for thin films is shown by a triangle in figure 2.…”

Section: Resultsmentioning

confidence: 97%

“…Recently electronic Raman scattering due to acceptor impurity (Walsh et al 1987) and Brillouin scattering (Lee et al 1988) were measured in MBE-ZnSe films. And further film thickness dependence of LO phonons by Raman measurement (Nakashima et al 1988) was explained in terms of the conversion of elastic strains to thermal strains.…”

Section: Introductionmentioning

confidence: 99%

Raman scattering of ZnSe grown by molecular beam epitaxy

Kumazaki

Imai

1990

J Chem Sci

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LO phonon frequency of ZnSe thin films on GaAs grown by molecular beam epitaxy (MBE) has been measured from 20 to 300 K by Raman scattering. Frequency shift of the ZnSe LO phonon is estimated in terms of elastic strains due to lattice mismatch and thermal strains due to the difference in thermal expansion coefficients of film and substate. Strains due to lattice mismatch for thin films are dominant at high temperatures, while thermal strains due to large differences between growth and measurement temperatures are dominant at low temperatures. Temperature dependence of full witdh at half maximum (FWHM) in LO phonon spectra of ZnSe are discussed in terms of imperfection and phonon contribution.

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Elastic properties of epitaxial ZnSe(001) films on GaAs measured by Brillouin spectroscopy

Cited by 46 publications

References 8 publications

Mechanical properties of diamond films: A comparative study of polycrystalline and smooth fine-grained diamonds by Brillouin light scattering

Mechanical properties of diamond films: A comparative study of polycrystalline and smooth fine-grained diamonds by Brillouin light scattering

Elastic Characterization of Transparent and Opaque Films, Multilayers and Acoustic Resonators by Surface Brillouin Scattering: A Review

Raman scattering of ZnSe grown by molecular beam epitaxy

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