Electric field compensation and sensing with a single ion in a planar trap

Narayanan, Suresh; Daniilidis, Nikos; Möller, Sönke; Clark, Robert; Ziesel, Frank; Singer, Kilian; Schmidt‐Kaler, F.; Häffner, Hartmut

doi:10.1063/1.3665647

Cited by 55 publications

(64 citation statements)

References 33 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Note added.-Since submission of this paper, an article about sensing and compensation of a stray field in a surface electrode trap using a similar technique has appeared [21]. The authors of this article measured the stray field along the trap axis over a length of approximately 2 mm.…”

Section: Resultsmentioning

confidence: 93%

Micromotion compensation in a surface electrode trap by parametric excitation of trapped ions

Tanaka

Masuda

et al. 2011

Appl. Phys. B

View full text Add to dashboard Cite

We report a surface electrode trap with a relatively large trap depth (0.6-1.0 eV). The trap electrodes are formed by gold plating an alumina substrate. Calcium ions are trapped approximately 400 µm above the trap surface. We demonstrate micromotion compensation based on parametric resonance for surface electrode traps. Unlike the conventional method based on radio-frequency (rf)-photon correlation in which the wave vector of the laser beam must have a component parallel to the micromotion to be detected, the proposed method is independent of the laser propagation direction. This enables the micromotion component normal to the electrode surface to be detected without increasing the scattered light.

show abstract

Section: Resultsmentioning

confidence: 93%

Micromotion compensation in a surface electrode trap by parametric excitation of trapped ions

Tanaka

Masuda

et al. 2011

Appl. Phys. B

View full text Add to dashboard Cite

show abstract

“…For all realizations with finite-size electrodes, particularly for segmented traps, regions of non-negligible axial micromotion cannot be avoided, although recent results have demonstrated trap designs with small residual axial rf field components [33,44,51,52].…”

Section: Micromotion Minimization In Three Dimensionsmentioning

confidence: 99%

“…Method ∆ε (V/m) [33] Photon-correlation spectroscopy 0.9 [3] / [38] / [37] Micromotional sideband spectroscopy 7 / 1 / 0.4 [40] Ion-cavity emmission spectroscopy 1.8 [45] / [44] Parametric excitation of secular motion 6 / 0.4 [31] Neutral atom loss 0.02 [42] Monitor displacement ≤ 11.8 This work…”

Section: Position Determination Application: Light Pressure Measumentioning

confidence: 99%

“…This can happen as a consequence of stray charges and, usually to a lesser extent, by drifting fields from unstable voltage supplies [44,46]. For surface traps trapping times can be in the second or minute range owing to smaller trap depths and might require frequent reloading and patch potentials may change on a short timescale.…”

Section: Introductionmentioning

confidence: 99%

“…The excitation of such a resonance causes a change in the ion's scattering rate, which is then minimized [43][44][45].…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Ion-trajectory analysis for micromotion minimization and the measurement of small forces

Gloger

Kaufmann

et al. 2015

Phys. Rev. A

View full text Add to dashboard Cite

For experiments with ions confined in a Paul trap, minimization of micromotion is often essential. In order to diagnose and compensate micromotion we have implemented a method that allows for finding the position of the radio-frequency (rf) null reliably and efficiently, in principle, without any variation of direct current (dc) voltages. We apply a trap modulation technique and focus-scanning imaging to extract three-dimensional ion positions for various rf drive powers and analyze the power dependence of the equilibrium position of the trapped ion. In contrast to commonly used methods, the search algorithm directly makes use of a physical effect as opposed to efficient numerical minimization in a high-dimensional parameter space. Using this method we achieve a compensation of the residual electric field that causes excess micromotion in the radial plane of a linear Paul trap down to 0.09 V/m. Additionally, the precise position determination of a single harmonically trapped ion employed here can also be utilized for the detection of small forces. This is demonstrated by determining light pressure forces with a precision of 135 yN. As the method is based on imaging only, it can be applied to several ions simultaneously and is independent of laser direction and thus well-suited to be used with, for example, surface-electrode traps.

show abstract

2D Linear Trap Array for Quantum Information Processing

et al. 2020

View full text Add to dashboard Cite

An ion‐lattice quantum processor based on a two‐dimensional arrangement of linear surface traps is presented. The design features a tunable coupling between ions in adjacent lattice sites and a configurable ion‐lattice connectivity, allowing one, for example, to realize rectangular and triangular lattices with the same trap chip. Detailed trap simulations of a simplest‐instance ion array with 2 × 9 trapping sites are presented and the fabrication of a prototype device in an industrial facility is reported on. The design and the employed fabrication processes are scalable to larger array sizes. Trapping of ions in rectangular and triangular lattices and transport of a 2 × 2 ion‐lattice over one lattice period are demonstrated.

show abstract

Electric field compensation and sensing with a single ion in a planar trap

Cited by 55 publications

References 33 publications

Micromotion compensation in a surface electrode trap by parametric excitation of trapped ions

Micromotion compensation in a surface electrode trap by parametric excitation of trapped ions

Ion-trajectory analysis for micromotion minimization and the measurement of small forces

2D Linear Trap Array for Quantum Information Processing

Contact Info

Product

Resources

About