Electric field intensity variation in the vicinity of a perfectly conducting conical probe: Application to near-field microscopy

Cory, H.; Boccara, Albert Claude; Rivoal, J. C.; Lahrech, Ahmed Chaouki

doi:10.1002/(sici)1098-2760(19980605)18:2<120::aid-mop10>3.0.co;2-b

Cited by 46 publications

(17 citation statements)

References 1 publication

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The field enhancement is dramatically dependent on the polarization state of the incident field. It has been shown that an incident p ‐polarization is suitable for efficient field enhancement (Martin & Girard, 1997; Novotny et al, 1997, 1998; Cory et al ., 1998; Furukawa & Kawata 1998; Zayats, 1999). It can be explained by the fact that the field enhancement effect involves mainly the field component perpendicular to the air–metal interface.…”

mentioning

confidence: 99%

Nano‐patterning photosensitive polymers using local field enhancement at the end of apertureless SNOM tips

H'Dhili

Bachelot

Rumyantseva

et al. 2003

Journal of Microscopy

View full text Add to dashboard Cite

SummaryWe show experimentally that local optical field enhancement can occur at the end of an apertureless SNOM tip illuminated by an external light source. Our approach consists in the use of a photosensitive polymer, placed in the tip near-field, to record intensity distribution in the vicinity of the tip end. The excited nanometre-size light source permits us to produce nano-patterns on the polymer surface which are then characterized by atomic force microscopy. Experimental images show the influence, on the field enhancement, of three important experimental parameters: the polarization state of the incident light, the geometry of the external illumination and the radius of curvature of the tip apex. These results are shown to be in good agreement with two-dimensional numerical calculations based on the finite-difference time-domain method. We show preliminary nanometre-size patterns created by this nanosource excited at a metallic tip extremity and discuss the potential of this approach for near-field optical lithography.

show abstract

mentioning

confidence: 99%

Nano‐patterning photosensitive polymers using local field enhancement at the end of apertureless SNOM tips

H'Dhili

Bachelot

Rumyantseva

et al. 2003

Journal of Microscopy

View full text Add to dashboard Cite

show abstract

“…The main difference between the probe and the aperture is the potential influence of the cone of the probe. Several studies [11,12] investigated the influence of the cone and showed that the cone acts as an antenna concentrating the electromagnetic field on the tip. Another parameter has then been investigated: the apex angle α of the probe (see Fig.…”

Section: Simulation Model and Resultsmentioning

confidence: 99%

True near field versus contrast near field imaging. II. imaging with a probe

Masson

Gallot

2007

Opt. Express

View full text Add to dashboard Cite

In this letter, we extend the results previously found in near field imaging with aperture [Opt. Express 14, 11566 (2006)], where we demonstrated that interaction between light and sample can be divided into two main areas: the true near field and the contrast near field domain. Here, we show that in near field with a probe, the same division of space exists, and thus we show that a much simpler way to model theses experiments can be given.

show abstract

“…An analytical model exists that allows the calculation of the field distribution around the tip extremity, illuminated by a plane wave. 9 It is shown that the field is localized and enhanced only at the metal tip end. This enhancement depends on the polarization and the angle of incidence of the incident light.…”

Section: Scattering Properties Of a Metallic Tipmentioning

confidence: 99%

“…This enhancement depends on the polarization and the angle of incidence of the incident light. [9][10][11] On the right side of figure 1, the intensity of the field in a plane located a few nanometers under the extremity of the tip is represented. On the left side of figure 1, we display the schematic model we have used to calculate the field distribution.…”

Section: Scattering Properties Of a Metallic Tipmentioning

confidence: 99%

Two- and three-dimensional near-field microscopy using scattering probes

Moneron¹,

Williame²,

Dubois³

et al. 2004

SPIE Proceedings

View full text Add to dashboard Cite

Scanning near-field optical microscopy (SNOM) has proven to be very powerful in terms of both resolution and efficiency. We report on new advances of this technique using metallic tips to scatter the optical field and induce dramatic field enhancements. We also present a new technique under development using multiple nanometric beads as scattering probes dispersed in the volume of the sample, rather than using a single tip. The bead positions are determined in three dimensions (3-D) with a precision better than the diffraction limit, making possible high-resolution 3-D imaging of hollow structures in relatively transparent materials.

show abstract

Electric field intensity variation in the vicinity of a perfectly conducting conical probe: Application to near-field microscopy

Cited by 46 publications

References 1 publication

Nano‐patterning photosensitive polymers using local field enhancement at the end of apertureless SNOM tips

Nano‐patterning photosensitive polymers using local field enhancement at the end of apertureless SNOM tips

True near field versus contrast near field imaging. II. imaging with a probe

Two- and three-dimensional near-field microscopy using scattering probes

Contact Info

Product

Resources

About