2005
DOI: 10.1007/s10853-005-0781-x
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Electrical and structural characteristics of non-stoichiometric Cu-based delafossites

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Cited by 22 publications
(9 citation statements)
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“…A combination of XRD and SEM/EDS data suggests that solid state synthesized CuGaO 2 delafossite ceramics tolerate very little variation in the Cu stoichiometry in Cu x GaO 2 [67]. Secondary phases were clearly observed at non-stoichiometric compositions x = 0.98 and x = 1.02.…”
Section: Electrical Properties Of Delafossitesmentioning
confidence: 93%
“…A combination of XRD and SEM/EDS data suggests that solid state synthesized CuGaO 2 delafossite ceramics tolerate very little variation in the Cu stoichiometry in Cu x GaO 2 [67]. Secondary phases were clearly observed at non-stoichiometric compositions x = 0.98 and x = 1.02.…”
Section: Electrical Properties Of Delafossitesmentioning
confidence: 93%
“…In principles, thick hole transporting layers are needed for reliable printed electronics device performance. The PEDOT:PSS conductivity is ~0.1 S/cm, which is about 10 times higher compared to CuGaO2 conductivity (0.02 -0.03 S/cm) as a result of lower metal oxide conductivity the thickness of CuGaO2 HTL is limited [52,53]. The current density versus voltage characteristic (J-V) curves of the best performing p-i-n devices under illumination and dark conditions are demonstrated in Fig.…”
Section: Device Performancementioning
confidence: 99%
“…Based on Cu2O chemistry, it could be assumed that the defects responsible of the p-type behaviour would be rather related to copper vacancies, the delafossite having weak tolerance for Cu non-stoichiometry, and/or interstitial oxygen defects while having higher activation energy and thus a lower probability to occur [1][47]. However, a study dealing with the cationic vacancy in CuGaO2 revealed that the p-type charge carrier is rather related to oxygen overstoichiometry [48].…”
Section: Electronic Transport Propertiesmentioning
confidence: 99%