Proceedings of ISES World Congress 2007 (Vol. I – Vol. V) 2008
DOI: 10.1007/978-3-540-75997-3_231
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Electrical Characterization and Measurements of Sin Thin Films On Crystalline Silicon Substrates By Pecvd

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“…A single or mu ltilayer dielectric AR coating has been studied and applied in industry. A single layer silicon nitride AR coating is easy to be fabricated by PECVD [2], but this technique cannot be employed due to the narrow band and narrow incident angle. To achieve broadband antireflection performance by fabricating mu ltilayer films, the thicknesses and optical constant of films must be well controlled [3] To analyze the diffraction characteristics of the structures of Fig.…”
Section: Introductionmentioning
confidence: 99%
“…A single or mu ltilayer dielectric AR coating has been studied and applied in industry. A single layer silicon nitride AR coating is easy to be fabricated by PECVD [2], but this technique cannot be employed due to the narrow band and narrow incident angle. To achieve broadband antireflection performance by fabricating mu ltilayer films, the thicknesses and optical constant of films must be well controlled [3] To analyze the diffraction characteristics of the structures of Fig.…”
Section: Introductionmentioning
confidence: 99%