2009
DOI: 10.1016/j.mssp.2009.12.001
|View full text |Cite
|
Sign up to set email alerts
|

Electrical characterization of current conduction in Au/TiO2/n-Si at wide temperature range

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

2
20
0
1

Year Published

2010
2010
2019
2019

Publication Types

Select...
7

Relationship

2
5

Authors

Journals

citations
Cited by 34 publications
(23 citation statements)
references
References 46 publications
2
20
0
1
Order By: Relevance
“…Thus, much of the research work is widespread on the application of thermodynamically metastable anatase phase. The deposition of titania by vacuum based processes are extensively investigated, but requires additional attention during the process [11][12][13][14]. Alternatively, solution based process is quite attractive, as titania can be obtained with high purity and chemical homogeneity [15].…”
Section: Introductionmentioning
confidence: 99%
“…Thus, much of the research work is widespread on the application of thermodynamically metastable anatase phase. The deposition of titania by vacuum based processes are extensively investigated, but requires additional attention during the process [11][12][13][14]. Alternatively, solution based process is quite attractive, as titania can be obtained with high purity and chemical homogeneity [15].…”
Section: Introductionmentioning
confidence: 99%
“…High purity (99.999%) Ti target was used to obtain TiO 2 film. Prior to the film deposition, Si substrate was sputter cleaned in pure argon ambient after raising the substrate temperature to 400 °C in 10 -8 mbar high vacuum in order to ensure the removal of any residual organics [20].…”
Section: Methodsmentioning
confidence: 99%
“…Alternative high-k materials such as Si 3 N 4 , HfO 2 , ZnO, ZrO 2 TiO 2 , Al 2 O 3 for SiO 2 have recently attracted great attention for its application as an interfacial insulator layer at metal/semiconductor (M/S) interface in the semiconductor devices such as metalinsulator/oxide-semiconductor (MIS or MOS) [1][2][3][4][5][6][7][8][9][10][11][12][13]. SiO 2 has a poor interface due to high leakage current, high temperature dispersion and high defect trapped charges.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, the fundamental requirement is using high k-dielectrics materials. In addition to high dielectric constant and band offers, low density of interface states and low leakage current [6][7][8][9][10][11][12][13]. Among these high-k materials, bulk TiO 2 is a potential candidate because of having different phases with extraordinarily high dielectric constant.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation