Electrical characterization of metal–molecule–silicon junctions

Comparison of Electronic Transport Characterization Methods for Alkanethiol Self-Assembled Monolayers

“…This is clearly not consistent with a tunneling dependence and may be due to various defects, such as grain boundaries in the SAM (molecular junctions in similar microscale devices have shown large sample-to-sample variations in current densities). 45 Thus, temperature-dependent measurements were attempted on these devices to further quantify the mechanisms, and it was found that these devices would not thermally cycle (failing within tens of degrees below room temperature), suggesting unstable molecule/metal contacts. Further, a relatively low device yield (typically less than ∼0.5%) compared to the nanopore method (see below) was observed.…”

Electrical conduction through single molecules and self-assembled monolayers

“…A large number of devices can be made simultaneously, i.e., large arrays of nanopores can be fabricated by E-beam lithography. This allows for determining the device yield out of a large collection of devices and statistics can be done on the data obtained for the working devices [136,138,139]. Since the device area can be controlled and measured accurately, the number of molecules in the junction is known with high Figure 9.…”

Interface characterization of molecular-monolayer/SiO2 based molecular junctions

“…The properties of molecular monolayers on thin SiO 2 are of great interest for future hybrid Si-molecular device technologies [6,[19][20][21][22][23][24]. In addition, the interface between organic materials and SiO 2 is critical for determining the device properties of organic electronic devices [25][26][27][28][29][30][31].…”