Electrical characterization of sol-gel derived PZT thin films

Bellur, K. R.; Alshareef, Husam N.; Rou, S. H.; Gifford, K. D.; Auciello, Orlando; Kingon, Angus I.

doi:10.1109/isaf.1992.300595

Cited by 14 publications

(5 citation statements)

References 12 publications

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“…Samples with a high degree of texture exhibit values close to 1 (0.93 for F =83%), while the values are lower for the samples with a low degree of texture (0.77 for F =26%). Similar behavior was observed for other crystallographically textured ferroelectrics including perovskite‐layer structured materials and perovskites, as well as thin films . However, the squareness ratio is still much lower as compared to a single crystal with

R_{normalSq} = 2

.…”

Section: Resultssupporting

confidence: 77%

“…Similar behavior was observed for other crystallographically textured ferroelectrics including perovskite-layer structured materials 52 and perovskites, 13,20,53 as well as thin films. 54,55 However, the squareness ratio is still much lower as compared to a single crystal with R Sq ¼ 2. The coercive field of highly textured samples (0.55-0.56 kV/mm) decreases by~18% as compared to the sample with a low degree of crystallographic texture (0.60-0.67 kV/mm), as shown in Table 3.…”

Section: Large-signal Measurementsmentioning

confidence: 96%

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Effect of degree of crystallographic texture on ferro‐ and piezoelectric properties of Ba_0.85Ca_0.15TiO₃ piezoceramics

et al. 2017

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Crystallographic texturing is a promising approach to reduce the performance gap between randomly oriented polycrystalline piezoelectrics and perfectly oriented single crystals. Here, the influence of the degree of crystallographic texture on the electromechanical properties and their temperature stability of the lead‐free perovskite ferroelectric Ba0.85Ca0.15TiO3 is investigated. Samples with a broad range of (100),(001) crystallographic texture (Lotgering factor 26%‐83%) were prepared by the reactive templated grain growth method. Crystallographic and microstructural analysis have been carried out using X‐ray diffraction and scanning electron microscopy, while the temperature‐dependent electromechanical properties were characterized by dielectric, piezoelectric, polarization, and strain measurements. It was revealed that the total bipolar strain and the coercive field are linearly dependent on the Lotgering factor. The total bipolar strain increased by 80%, whereas the coercive field decreased by 18% due to crystallographic texturing. Likewise, the temperature stability of the electromechanical properties of the samples was found to be dependent on the degree of texture. A sample with a high degree of texture exhibited a Curie temperature of 117°C, which is 21% higher compared to a counterpart with a low degree of texture. This was related to chemical inhomogeneity and a modified internal mechanical stress state.

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R_{normalSq} = 2

.…”

Section: Resultssupporting

confidence: 77%

Section: Large-signal Measurementsmentioning

confidence: 96%

Effect of degree of crystallographic texture on ferro‐ and piezoelectric properties of Ba_0.85Ca_0.15TiO₃ piezoceramics

et al. 2017

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“…The perovskite transformation of the sol-gel processed PZT thin film has been reported to be controlled by the nucleation in the other studies. [10][11][12] We have fabricated (100) and (111) oriented PZT thin films on Pt͞Ti͞glass substrates using the sol-gel method. The Pt͞Ti layer has been known to serve as the nucleation site and to affect the perovskite transformation of the PZT thin films deposited on the Pt͞Ti͞SiO 2 ͞Si substrate.…”

Section: Introductionmentioning

confidence: 99%

A Study on the Microstructure of Preferred Orientation of Lead Zirconate Titanate (PZT) Thin Films

et al. 1997

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The lead zirconate titanate (PZT) thin films were fabricated using sol-gel spin coating onto Pt͞Ti͞glass substrates. Effects of the holding time for pyrolysis and the coating cycle on the preferred orientation of the PZT thin films were studied. The films were fabricated with different coating cycles (3,5,7,9,11), dried at 330 ± C for different holding times (5, 30, 60 min), and then annealed at the same temperature of 650 ± C using rapid thermal annealing (RTA). The preferred orientations of the films were investigated using x-ray diffraction and glancing angle x-ray diffraction. The microstructure and the selected area diffraction pattern of the PZT thin films were also investigated using scanning electron microscopy (SEM) and transmission electron microscopy (TEM), respectively.

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“…[11][12][13][14] Several recent papers discuss the effects of microstructure and texture ("epitaxy") on the switching and fatigue properties of PZT thin films. 15 In this work, the term texture is used to describe films of columnar structure that show a preferred growth direction with respect to the z-axis (substrate normal) and a random orientation in the x-y plane (plane of film) as discussed in greater detail below. Bellur et al investigated polycrystalline films of the morphotropic composition deposited on Pt electrodes and being either randomly oriented or (001) textured ("epitaxial") prepared on Pt on MgO.…”

Section: Introductionmentioning

confidence: 99%

Influence of texture on the switching behavior of Pb(Zr_0.70Ti_0.30)O₃ sol-gel derived thin films

Brooks¹,

Klissurska²,

Moeckli³

et al. 1997

J. Mater. Res.

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Rhombohedral Pb(Zr 0.70 Ti 0.30 )O 3 thin films of four different well-defined textures, namely, (100), (111), bimodal (110)͞(111), and (100)͞(111), were prepared by a sol-gel method. The films were characterized in terms of grain size, presence of second phases, surface roughness, columnarity of grains, and other microstructural features. The dielectric, ferroelectric, and fatigue properties were investigated, with emphasis on the hysteresis switching characteristics. Results are discussed from the reference point of the allowable spontaneous polarization directions available for the different textures. The values of coercive field, remanent and saturation polarization, and slope of the loop at the coercive field, at saturating fields can be qualitatively explained based on the texture, independent of microstructural differences. The occurrence of surface pyrochlore, however, is observed to affect the functionality of the saturation curves, particularly for the samples of bimodal texture. Shearing of the hysteresis curves of the bimodal films is also attributed to surface microstructural features. The occurrence of nonswitching 71± or 109 ± domains in the (111) and (110)

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Electrical characterization of sol-gel derived PZT thin films

Cited by 14 publications

References 12 publications

Effect of degree of crystallographic texture on ferro‐ and piezoelectric properties of Ba_0.85Ca_0.15TiO₃ piezoceramics

Effect of degree of crystallographic texture on ferro‐ and piezoelectric properties of Ba_0.85Ca_0.15TiO₃ piezoceramics

A Study on the Microstructure of Preferred Orientation of Lead Zirconate Titanate (PZT) Thin Films

Influence of texture on the switching behavior of Pb(Zr_0.70Ti_0.30)O₃ sol-gel derived thin films

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Electrical characterization of sol-gel derived PZT thin films

Cited by 14 publications

References 12 publications

Effect of degree of crystallographic texture on ferro‐ and piezoelectric properties of Ba0.85Ca0.15TiO3 piezoceramics

Effect of degree of crystallographic texture on ferro‐ and piezoelectric properties of Ba0.85Ca0.15TiO3 piezoceramics

A Study on the Microstructure of Preferred Orientation of Lead Zirconate Titanate (PZT) Thin Films

Influence of texture on the switching behavior of Pb(Zr0.70Ti0.30)O3 sol-gel derived thin films

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Resources

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Effect of degree of crystallographic texture on ferro‐ and piezoelectric properties of Ba_0.85Ca_0.15TiO₃ piezoceramics

Effect of degree of crystallographic texture on ferro‐ and piezoelectric properties of Ba_0.85Ca_0.15TiO₃ piezoceramics

Influence of texture on the switching behavior of Pb(Zr_0.70Ti_0.30)O₃ sol-gel derived thin films