2016
DOI: 10.1002/pssa.201532667
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Electrical characterization of ZnO/4H‐SiC n–p heterojunction diode

Abstract: Phone/Fax: þ48 22 234 7932The structure and electrical properties of zinc oxide (ZnO) thin films fabricated by atomic layer deposition (ALD) as well as electrical properties of ZnO/4H-SiC n-p heterojunction diodes were investigated. Hall measurements of ZnO films show their n-type high intrinsic conductivity. Structural characterization of the ZnO layers performed using X-ray diffraction show their polycrystalline morphology. Aluminum (Al) ohmic contacts fabricated to n-ZnO demonstrate linear characteristics a… Show more

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Cited by 5 publications
(2 citation statements)
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“…Moreover, other high-κ binary oxides with larger band gaps and more favourable band alignment with SiC, such as Al 2 O 3 [101], La 2 O 3 [59,103], and ZrO 2 [104,105], have been investigated.…”
Section: Binary High-κ Oxides In 4h-sic Mosfetsmentioning
confidence: 99%
“…Moreover, other high-κ binary oxides with larger band gaps and more favourable band alignment with SiC, such as Al 2 O 3 [101], La 2 O 3 [59,103], and ZrO 2 [104,105], have been investigated.…”
Section: Binary High-κ Oxides In 4h-sic Mosfetsmentioning
confidence: 99%
“…The authors report herein various material synthesis aspects like zirconia coatings fabricated by aerosol‐gel routine, enhanced with low temperature plasma discharge , 65 nm‐thick ZnO nanowires grown by a cost‐effective process called chemical bath deposition or ALD growth of electrically efficient ZnO/4H‐SiC n‐p heterojunction diodes .…”
mentioning
confidence: 99%