2015
DOI: 10.1016/j.jascer.2015.10.001
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Electrical conduction mechanism in BiFeO3-based ferroelectric thin-film capacitors: Impact of Mn doping

Abstract: Electrical conduction properties of SrRuO 3 (SRO)/BiFeO 3 (BFO)/SRO and SRO/10% Mn-doped BFO(BFMO)/SRO ferroelectric thin-film capacitors are investigated. The BFO capacitors exhibit a switchable diode effect accompanied by a conduction change from ohmic to space-charge-limited current with increasing external field. In contrast, the BFMO capacitors show only an ohmic conduction, arising from a considerable reduction in depletion layer width at the SRO/BFMO interfaces. These results suggest that the diode prop… Show more

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Cited by 20 publications
(7 citation statements)
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“…Likewise, similar behavior indicating a swift slope (∼8.3) is shown above the TFL region. Indeed, this is often found in leakage mechanisms of BiFeO 3 films, reported previously 29,30) The polarization versus electric field (P-E) hysteresis loops of the columnar BiFeO 3 thick films measured at 20 kHz and RT are shown in Fig. 5.…”
Section: Electric and Ferroelectric Properties Of Columnar Bifeo 3 Th...supporting
confidence: 59%
“…Likewise, similar behavior indicating a swift slope (∼8.3) is shown above the TFL region. Indeed, this is often found in leakage mechanisms of BiFeO 3 films, reported previously 29,30) The polarization versus electric field (P-E) hysteresis loops of the columnar BiFeO 3 thick films measured at 20 kHz and RT are shown in Fig. 5.…”
Section: Electric and Ferroelectric Properties Of Columnar Bifeo 3 Th...supporting
confidence: 59%
“…As the voltage decreases, the Ohmic conduction mechanism is restored. The same transition law is applied to the positive bias region, the Ohmic conduction is performed at low voltage, and the Child's law is met at high voltage, a jump process with large slope between HRS and LRS, which is consistent with the mechanism of trapcontrolled Space-ChargeLimited-Conduction (SCLC) [22,23]. Since Ohmic conductance and SCLC conductance are both bulk-limited conductance mechanisms, it can be judged that the first type RS behavior is caused the generation and fracture of oxygen vacancy conductive filaments (CF) [24][25][26].…”
Section: Resultsmentioning
confidence: 56%
“…Moreover, BFMO5 films exhibit higher dark conductivity (σ dark ) than BFO films irrespective of their domain structures, probably because Mn atoms create electron-half-occupied defect states within the bandgap that can act as an acceptor level. 40)…”
Section: Resultsmentioning
confidence: 99%