2014
DOI: 10.1088/0031-8949/89/6/065802
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Electrical parameters of Al/InSe/C RF sensors

Abstract: An Al/InSe/C Schottky device is designed on the surface of amorphous InSe thin films. The device is observed to exhibit a switching property at particular biasing voltages. The ‘on/off’ current ratio is found to be 7.9 and 9.3 at forward and reverse biasing voltages of 2.0 and 2.25 V, respectively. The ‘off’ and ‘on’ operational modes are ascribed to the domination of the tunneling of charged particles through a barrier height of 0.83 eV with a depletion region width of 64 nm and due to the domination of the t… Show more

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Cited by 17 publications
(18 citation statements)
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“…The zero‐bias barrier height (φ0) and depletion region width ( w ) of the Richardson–Schottky current in accordance with the equations discussed in Ref. at the reverse‐biased Al/Ge device side is 0.94 eV and 0.129 mm, respectively.…”
Section: Resultssupporting
confidence: 78%
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“…The zero‐bias barrier height (φ0) and depletion region width ( w ) of the Richardson–Schottky current in accordance with the equations discussed in Ref. at the reverse‐biased Al/Ge device side is 0.94 eV and 0.129 mm, respectively.…”
Section: Resultssupporting
confidence: 78%
“…The calculation of I SR theoretical values in accordance with the equation given in Ref. reveals a good fit to the experimental data of the Al/Ge/BN/C device during forward‐biased operation mode provided that the Al/Ge works as a reverse‐biased device (i.e., I SR values are negative during forward biasing of Al/Ge/BN/C).…”
Section: Resultssupporting
confidence: 64%
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